Purchase Order 1333ND26PNB030053
- Not listed
- The National Institute of Standards and Technology (NIST) awarded a $660,598 firm fixed-price purchase order to Tescan USA Inc. on September 21, 2022, for the procurement of a variable pressure field emission scanning electron microscope (SEM) system and four years of preventative maintenance services. The microscope and associated services support NIST's infrastructure materials research activities at its Gaithersburg, Maryland facility. This competitive procurement was issued without set-aside...
- The Department of Commerce National Institute of Standards and Technology awarded a $361,584.75 firm fixed price purchase order to Semiprobe, Inc. for the purchase of a magnetic probe station. The contract is being awarded non-competitively based on a special notice issued by NIST announcing their intent to sole source the procurement due to technical requirements only met by Semiprobe's SA-8 200mm prober. The notice specified requirements for wafer stage motion and placement accuracy, magnet...
- This $1,079,500.00 firm fixed-price purchase order was awarded by the National Institute of Standards and Technology (NIST), a civilian federal agency, to Tescan USA Inc., the U.S. subsidiary of the Czech-based Tescan ORSAY HOLDING. The contract is for the purchase of a scanning electron microscope (SEM) to be used in x-ray tomography applications. The original solicitation was a sources sought notice seeking information from vendors capable of providing an SEM system meeting NIST's technical...
- This federal contract award is for the procurement of a Semi-Automatic Probe Station by the National Institute of Standards and Technology (NIST). The contract is valued at $331,560.00 and was awarded on September 3, 2025 to Lucas Signatone Corp, doing business as Lucas Labs, a small business manufacturer of semiconductor testing equipment and precision scientific instrumentation located in Gilroy, California. The probe station is required to support research on silicon carbide field effect...
- The Department of Commerce National Institute of Standards and Technology (NIST) awarded a $334,986.00 firm fixed-price purchase order to Tescan USA Inc., a U.S. subsidiary of the Czech scanning electron microscope manufacturer Tescan ORSAY HOLDING. The contract is to incorporate in-situ scanning electron microscope (SEM) capabilities into the ultra-high vacuum (UHV) analysis chamber of an existing CAMECA LEAP3000X-SI atom probe tomograph for real-time specimen shape imaging and sample and...
- The Department of Commerce's National Institute of Standards and Technology (NIST) awarded a $23,858 purchase order to Sepax Technologies Inc. to deliver three scanning electron microscope columns. The firm fixed price contract has a period of performance from August 18, 2023 through October 30, 2023 for work conducted in Newark, Delaware. NIST supports measurement science and standards that drive technological innovation and economic growth for U.S. industry through its Physical Measurement...
- This is a firm fixed-price purchase order contract awarded by the National Institute of Standards and Technology (NIST), a civilian federal agency, to FEI Company, a manufacturer of materials analysis equipment. The contract is for the delivery of a scanning electron microscope (SEM) with electron beam lithography capability, with a ceiling value of $784,156.00. The contract does not have a set-aside designation. The place of performance is in Hillsboro, Oregon. FEI Company is a division of...
- The National Institute of Standards and Technology (NIST) awarded a firm-fixed-price purchase order contract valued at $1,423,700.00 to Carl Zeiss SMT Inc. for a Focused Ion Beam (FIB)/Scanning Electron Microscopy (SEM) microscope. The contract does not have a set-aside designation and has an ultimate completion date of May 30, 2012. NIST is a civilian federal agency that conducts research and provides measurement standards and services. This contract supports NIST's mission to promote U.S....
- The U.S. National Institute of Standards and Technology (NIST) within the Department of Commerce awarded a $36,155.00 firm-fixed-price purchase order contract to Instec, Incorporated, a small business manufacturer of scientific instrumentation, to provide a high-temperature vacuum probe station system. This procurement was set aside for small businesses under NAICS code 334516 (Analytical Laboratory Instrument Manufacturing). The probe station will support NIST's CHIPS Metrology program and...
- The National Institute of Standards and Technology (NIST) awarded a $655,369 firm fixed-price purchase order to Tescan USA Inc. on July 24, 2024, for the procurement of a Tescan Mira4 scanning electron microscope (SEM) equipped with automated particle analysis capabilities. The contract, which carries an ultimate completion date of February 10, 2025, will be performed in Warrendale, Pennsylvania. No set-aside designation was applied to this award, reflecting Tescan USA Inc.'s competitive...
The National Institute of Standards and Technology (NIST), a civilian agency under the Department of Commerce, awarded a $353,247.50 firm fixed-price purchase order to Go Green Power Solutions, LLC for a scanning electron microscope (SEM) probe station. The contract, designated OU03-FY26-217-NEW, was awarded on March 20, 2026, with a completion date of July 24, 2026, and will be performed in Boulder, Colorado. This procurement includes no set-aside designations and was not competitively restricted to any specific vendor category. The equipment supports NIST's CHIPS Act metrology research initiatives, specifically Grand Challenge 1 focused on Materials Purity, Properties, and Provenance. The SEM probe station will enable correlative imaging and analysis of two-dimensional and wide bandgap materials at single- to sub-nanometer spatial resolution, facilitating live imaging while materials degrade under electronic and applied stresses. This capability will allow researchers to evaluate material quality, measure device performance, and inform material optimization efforts for advanced semiconductor applications.
Name | Description | Solicitation Number | FederalAgency | Type | PostedDate |
|---|---|---|---|---|---|
Atomic Force Microscope for use in a Scanning Electron Microscope | 1333ND26QNB030045 | Department of Commerce National Institute of Standards and Technology | Solicitation 2/2 | 2/10/26, 10:21 AM | |
Atomic Force Microscope for use in a Scanning Electron Microscope | NIST-SS26-CHIPS-34 | Department of Commerce National Institute of Standards and Technology | Pre-Solicitation 1/2 | 12/4/25, 1:30 PM |
Mod # | Description | ReasonForModification | Federal Obligation | Date |
|---|---|---|---|---|
| Not listed | Not listed | $353.2k | 3/19/26 |