Attachement 1 - Technical Specifications.pdf
PDF 70 KB Posted
- Attached to
- High Voltage Probe Station
- Solicitation number
- RFQ_2024020028
- Issued by
-
Department of Energy Office of Science
About this file
This document is the Technical Specifications for a high voltage probe station required by the National Renewable Energy Laboratory (NREL). The key details are:
The objective is to acquire a probe station that can interface with NREL's recently acquired Keysight Power Device Analyzer (PDA) to characterize novel semiconductor materials, including gallium oxide, silicon, silicon carbide, and gallium nitride. The required capabilities include the ability to measure devices under high voltage (up to 10 kV) and high current conditions, with a 300mm probing stage and temperature range of -100C to 300C. The probe station must be compatible with the Keysight PDA, have an enclosed dark box design, and include an imaging system. Delivery is required by September 30, 2024, and the equipment must meet NRTL safety standards and fit within the available 48" x 48" space next to the PDA. This probe station will support multiple NREL research groups working on Department of Energy and non-DOE projects.
View the file
Other files
On GovTribe
Work with this file
- Download the original file
- Contacts named in this file
- Similar government files
- Ask GovTribe AI about this file
Text version
"High Voltage Probe Station"
04/15/2024
BACKGROUND
A probe station is designed to allow researchers to apply voltage and current to very specific location on semiconductor devices. There are multiple existing probe stations at the National Renewable Energy Laboratory (NREL), but none are capable of utilizing the recently acquired Keysight Power Device Analyzer (PDA) (Model B1505A). The Keysight PDA is an ultra high voltage / high current capable curve tracer. None of the existing probe stations at NREL can handle the voltage and current delivered by the B1505A.
This equipment will be used by multiple groups for Department of Energy (DOE) and non-DOE projects. Groups include but are not limited to the Material Science group, the Solar group, and the Advanced Power Electronics group.
OBJECTIVE
This equipment will immediately be used to characterize novel semiconductors being grown by the material science group. Gallium Oxide semiconductors have the advantage of being able to block very high voltages. Currently there is no probe station at NREL able to characterize these devices to their full potential.
SPECIFICATIONS:
REQUIRED CAPABILITIES
• Equipment must be capable of characterizing bare semiconductor devices under high voltage / high current conditions.
• The main reason for this purchase is to interface with the existing Keysight power device analyzer. The PDA, as it is right now, is capable of characterizing semiconductors with ultra-high precision, but only after the device has already been packaged. The probe station will allow NREL to perform the tests on the bare device, which negates any error in measurements that can be introduced from the packaging.
• Processing Equipment: The probe station must be capable of measuring Gallium Oxide, Silicon, Silicone Carbide, and Gallium nitride devices. It will be used to measure a variety of characteristics related to diodes and three-terminal devices such as metal-oxide-semiconductor field-effect transistor MOSFETS and insulated-gate bipolar transistors IGBTs.
• All electronics should be compatible with the Keysight B1505A Power Device Analyzer.
• The system should have probe manipulators capable of reaching up to 10 kV and capable of performing Direct Current (DC)/Pulse/Radiofrequency (RF) measurements.
• The tool should have a dark box or be an enclosed system.
• Samples under testing vary from 10 mm to 300 mm. The system should have at least a 300 mm probing stage. The stage should have approximately 100 mm X-Y travel distance in each direction. A motorized stage is preferable.
• The probing stage should have high voltage capability (for backside probing) and temperature capability. Voltage: 10 kV, Temperature: -100°C to 300°C. Any system with a larger temperature range is welcomed.
• The stage should have a vacuum chuck.
• The probe station should have an imaging system, including a display, camera, and microscope with multiple objective lenses: 5x, 10x, 20x, and 50x.
• Any semi-automated system/program that can help to reduce sample measurement time by facilitating easy alignment is welcomed.
• The system should come with a vibration-isolated table with optical breadboard.
TECHNICAL OR SAFETY REQUIREMENTS
• The equipment must be built to Nationally Recognized Testing Laboratory (NRTL) standards and have the supporting documentation.
• Space Requirements/ Limitations o The equipment must fit in the existing space next to the Keysight PDA.
Maximum dimensions for the equipment are: 48” x 48”
TIMELINE
• Delivery needed by September 30, 2024.
File details come from the government source that posted it. Updated .