Suite of Scanning Electron and Focused Ion Beam Microscopes
Closed Pre-Solicitation Posted
This opportunity was awarded. See the award notice from , or the latest solicitation from .
- Solicitation number
- NIST-SS23-CHIPS-0025
- Agency
-
National Institute of Standards and Technology
Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Boulder, Colorado 80305, United States
Notice details come from SAM.gov. Updated .
About this opportunity
The National Institute of Standards and Technology seeks to procure a suite of three scanning electron and focused ion beam microscopes to meet research needs. Responses are requested to a sources sought notice to provide information on commercial item solutions meeting minimum specifications for two focused ion beam/scanning electron microscope systems specialized for transmission electron microscopy and atom probe tomography sample preparation, and one scanning electron microscope system. Common requirements include identical sample stage and goniometer geometry, software, and Python scripting capability. Responses are due by November 23 to help the agency determine acquisition requirements.
There is no set-aside designated for this potential procurement. The main NAICS code is 334516 and PSC code is Q200. Budget details were not provided, but the scope includes three microscopy systems. Specifications in the notice and attached lab layout indicate needs for multiple instruments to support sample transfer between systems. This market research will be used to develop a formal solicitation for the scanning electron and focused ion beam microscopes.
Notice text
THIS IS A SOURCES SOUGHT NOTICE
PLEASE SEE ATTACHMENT NIST-SS23-CHIPS-0025 AND APPLICABLE PDF Focused Ion Beam Lab Layout (81-1C109).pdf FOR COMPLETE NOTICE DETAILS ...
Files
| File | Type | Posted |
|---|---|---|
| 0025-Focused Ion Beam Lab Layout (81-1C109).pdf | ||
| NIST-SS23-CHIPS-0025.docx | DOCX document |
Notice history
| Notice | Type | Posted |
|---|---|---|
| Suite of Focused Ion Beam and Scanning Electron Microscope Instruments | Award Notice | |
| Suite of Focused Ion Beam and Scanning Electron Microscope Instruments | Solicitation | |
| This notice | Pre-Solicitation |
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