Suite of Focused Ion Beam and Scanning Electron Microscope Instruments

Closed Solicitation Posted

This opportunity was awarded. See the award notice from .

Solicitation number
NB6800002300593
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

Place of performance
Boulder, Colorado 80305, United States

Notice details come from SAM.gov. Updated .

About this opportunity

This solicitation seeks a suite of three focused ion beam and scanning electron microscope instruments from a single manufacturer to be provided to the National Institute of Standards and Technology. The suite includes one instrument specialized for high quality sample preparation, one for structural and chemical characterization of materials, and one scanning electron microscope for chemical and structural characterization. Quotes are due by June 16, 2023 and will be evaluated based on technical capability, past performance, and price.

The solicitation does not include any set-aside designations. The primary NAICS code is 334516 and PSC code is Q201. No potential incumbents or current contractors are named. Delivery and acceptance of the instruments must occur within 56 weeks for the first system, 40 weeks for the second, and 30 weeks for the third at NIST's Boulder, Colorado facility according to the statement of work. Award is a firm-fixed price contract not to exceed 64 months in duration with optional annual maintenance contracts available for up to five years for each system.

Notice text

5 versions

Update #5 · Latest ·

This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.

The solicitation number is NB680000-23-00593 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.

NIST is seeking a suite of three instruments from the same manufacturer:

  1. A focused ion beam/scanning electron microscope system specializing in high quality sample preparation
  2. A focused ion beam/scanning electron microscope system specializing in structural and chemical characterization of materials
  3. A scanning electron microscope system specializing in chemical and structural characterization of materials

SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.

- Amendment 0001 dated 15-MAR-2023 updates the SOW. All other terms and conditions remain unchanged.

- Amendment 0002 dated 28-MAR-2023 answers offeror questions, updates provisions and clauses through FAC 2023-02 dated March 16, 2023, and extends the quote due date. See Attachment 2 Q&A Set #1 dated March 28, 2023.

- Amendment 0003 dated 29-MAR-2023 updates and replaces Attachment 2 Q&A Set #1 to clarify previous Government responses.

- Amendment 0004 re-opens the solicitation and updates the statement of work. Requesting revised quotes in accordance with Amendment 0004.

Update #4 ·

This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.

The solicitation number is NB680000-23-00593 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.

NIST is seeking a suite of three instruments from the same manufacturer:

  1. A focused ion beam/scanning electron microscope system specializing in high quality sample preparation
  2. A focused ion beam/scanning electron microscope system specializing in structural and chemical characterization of materials
  3. A scanning electron microscope system specializing in chemical and structural characterization of materials

SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.

- Amendment 0001 dated 15-MAR-2023 updates the SOW. All other terms and conditions remain unchanged.

- Amendment 0002 dated 28-MAR-2023 answers offeror questions, updates provisions and clauses through FAC 2023-02 dated March 16, 2023, and extends the quote due date. See Attachment 2 Q&A Set #1 dated March 28, 2023.

- Amendment 0003 dated 29-MAR-2023 updates and replaces Attachment 2 Q&A Set #1 to clarify previous Government responses.

Update #3 ·

This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.

The solicitation number is NB680000-23-00593 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.

NIST is seeking a suite of three instruments from the same manufacturer:

  1. A focused ion beam/scanning electron microscope system specializing in high quality sample preparation
  2. A focused ion beam/scanning electron microscope system specializing in structural and chemical characterization of materials
  3. A scanning electron microscope system specializing in chemical and structural characterization of materials

SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.

- Amendment 0001 dated 15-MAR-2023 updates the SOW. All other terms and conditions remain unchanged.

- Amendment 0002 dated 28-MAR-2023 answers offeror questions, updates provisions and clauses through FAC 2023-02 dated March 16, 2023, and extends the quote due date. See Attachment 2 Q&A Set #1 dated March 28, 2023.

Update #2 ·

This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.

The solicitation number is NB680000-23-00593 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.

NIST is seeking a suite of three instruments from the same manufacturer:

  1. A focused ion beam/scanning electron microscope system specializing in high quality sample preparation
  2. A focused ion beam/scanning electron microscope system specializing in structural and chemical characterization of materials
  3. A scanning electron microscope system specializing in chemical and structural characterization of materials

SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.

- Amendment 0001 dated 15-MAR-2023 updates the SOW. All other terms and conditions remain unchanged.

Update #1 ·

This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5.

The solicitation number is NB680000-23-00593 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open.

NIST is seeking a suite of three instruments from the same manufacturer:

  1. A focused ion beam/scanning electron microscope system specializing in high quality sample preparation
  2. A focused ion beam/scanning electron microscope system specializing in structural and chemical characterization of materials
  3. A scanning electron microscope system specializing in chemical and structural characterization of materials

SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.

Files

Notice history

Notice Type Posted
Suite of Focused Ion Beam and Scanning Electron Microscope Instruments Award Award Notice
This notice Latest solicitation Solicitation
Suite of Scanning Electron and Focused Ion Beam Microscopes Original Pre-Solicitation

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