0025-Focused Ion Beam Lab Layout (81-1C109).pdf

This document provides details on a sources sought notice issued by the National Institute of Standards and Technology. The notice is seeking information from potential vendors for a suite of scanning electron and focused ion beam microscopes. Interested parties are asked to review the attached PDF file containing additional specifications, such as requirements for a focused ion beam lab layout. Responses to the sources sought notice are due by the specified date to help the agency determine acquisition requirements for these microscopy systems. The National Institute of Standards and Technology intends to use this market research to develop a future solicitation for the procurement of scanning electron and focused ion beam microscopes.