Amendment_0003_SB134115RQ0551.pdf

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Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
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SB1341-15-RQ-0551
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Amendment 0003

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Amendment_0002_SB134115RQ0551.pdf PDF
Amendment_0001_SB134115RQ0551.pdf PDF
NIST_SB134115RQ0551_SOW.pdf PDF
NIST_SB134115RQ0551_RFQ.pdf PDF

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Amendment 0003 - SB1341-15-RQ-0551 (FIB-SEM)

The purpose of this amendment is to answer a question posed by a potential quoter and to amend two specifications for CLIN 0009.

Question 1: Regarding SOW sections 4.1, 5.7, and line item 0005: Will NIST accept engineering support and consultation from the vendor that allows integration of a NIST-provided AFM solution? Is this an acceptable exception?

Answer 1: No, the integrated AFM is specified as a required option.

CLIN 0009 Specification 5 is hereby amended to read: “5. System shall include software for performing basic data acquisition and analysis of EDS and EBSD data. Stronger consideration will be given to systems compatible with a broader range of add-on software packages that can be purchased in the future for specialized data acquisition and analysis.”

CLIN 0009 Specification 6 is hereby amended to read: “6. Software shall include streamlined workflow operation, as well as access to, and control of, advanced features.”

All other terms and conditions, including closing date and time, remain unchanged and in full effect.

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