Amendment_0001_SB134115RQ0551.pdf
PDF 95 KB Posted
- Attached to
- Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Federal contract opportunity
- Solicitation number
- SB1341-15-RQ-0551
About this file
Amendment 0001 to SB1341-15-RQ-0551 (FIB-SEM)
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Other files for this federal contract opportunity
| File | Type | Posted |
|---|---|---|
| Amendment_0003_SB134115RQ0551.pdf | ||
| Amendment_0002_SB134115RQ0551.pdf | ||
| NIST_SB134115RQ0551_SOW.pdf | ||
| NIST_SB134115RQ0551_RFQ.pdf |
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Text version
Amendment 0001 - SB1341-15-RQ-0551 (FIB-SEM)
The purpose of this amendment is to change Specification 3.3 in the Statement of Work, and to update the Addendum to FAR 52.212-1, Quotation Preparation Instructions accordingly.
Specification 3.3 in the Statement of Work is hereby amended to read, “Minimum spot size (resolution) shall be demonstrated on graphite or similar FIB resolution target. The Offeror shall include digital images to support a minimum spot size (resolution) no larger than 3 nm (or best achievable), based on a statistical analysis of at least 50 edges in a sample FIB image as part of the required quotation submissions (See addendum to FAR 52.212-1 Quotation Preparation Instructions under Technical
Capability for further details).”
In addition, the Addendum to FAR 52.212-1, Quotation Preparation Instructions is hereby amended to include the following: “In accordance with Specification 3.3, Offeror shall provide digital images to support its claimed spot size based on a statistical analysis of at least 50 edges in a sample FIB image.”
All other terms and conditions of the RFQ, including closing date and time, are unchanged and in full effect.
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