AMCOM Equipment List (Updated 19 May).pdf
PDF 152 KB Posted
- Attached to
- Advanced Micro-Characterization of Materials (AMCOM) Federal contract opportunity
- Solicitation number
- FA8650-22-S-5010
- Issued by
- Department of the Air Force
About this file
This document outlines equipment and facilities available for a materials characterization research program. The Advanced Micro-Characterization of Materials program focuses on utilizing state-of-the-art electron, X-ray, and ion-optical techniques to characterize novel materials developed at the Air Force Research Laboratory. A wide range of material types may be analyzed, including metals, semiconductors, ceramics, polymers, composites, functionally graded materials, nanomaterials, electronic materials, sensor materials, and biological materials. The contractor shall perform research in materials microstructural and compositional analysis, and prepare reports, papers, presentations, technical data, and best practices guidance to assist the U.S. Air Force and U.S. Space Force in assessing new optical technologies and materials performance. Available equipment includes several electron microscopes, X-ray diffraction systems, ion mills, sputter coaters, polishing equipment, and other materials characterization tools. The facilities are located at Wright-Patterson Air Force Base.
View the file
Other files for this federal contract opportunity
| File | Type | Posted |
|---|---|---|
| AMCOM Industry Day Briefing Charts.pdf | ||
| AMCOM Industry Day - Questions Answers.pdf | ||
| AMCOM Equipment List.pdf | ||
| AMCOM Industry Day Information.pdf | ||
| NOCA -Advanced Micro Characterization of Materials (AMCOM).pdf |
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Text version
Building 655: Office space along with phone, computer access, desks, chairs, and file storage for up to 12 people. Rooms: 058, 061, 063, 093A.
Building 655, Research facilities: Rooms: 057/095 (Ion Mills), 062B (Sample Prep), 059 (Transmission Electron Microscope), 067A (Microtome, Cryo-Prep), 062 (Scanning electron Microscope), 064 (Sample Prep), 064B (Sample Prep), 067 (Scanning Electron Microscope/EBSD), 074 (Sputter Coating), 083 (Chemical Lab), 085 (Laser Prep, Image Analysis and Microindentation), 092 (Transmission Electron Microscope), 093 (Scanning Electron Microscope), 093A (Remote Microscopy), 095 (Focused Ion Beam), 094 (Cryo Transmission Electron Microscopy), 096 (Microprobe), 097 (Metallography Lab), 098 (Focused Ion Beam), 099 (Polishing), 099A (Sample Prep), 136 (X-ray diffraction)
Building 654, Research Facilities: Rooms: 225 (Scanning Electron Microscope), 04 (X-ray Computed Tomography)
Base Support Equipment List Metallography, Conventional Sample Prep and Imaging
1 Allied PowerCut 10x 2 Buehler High Speed Grinders 2 Allied TechCut 5 Saws 4 Buehler IsoMet 1000 Saws 2 Allied TechCut 4 Saws 1 Buehler Isomet 5000 5 Benchtop Optical Microscopes 3 Buehler Mounting Presses 11 Buehler Polishers 7 Buehler Vibratory Polishers 3 Buehler Roll Grinders 2 Hardness testers (1 automated) 2 Olympus Metallographs 1 Keyence Optical Microscope System 1 Struers Electopolisher 5 1 Struers Exotom Saw 2 Struers Mounting Presses 2 VCR Group Dimpler 1 Zeiss Automated Metallograph
Cryo-EM and Soft Material Prep 1 Cryo Transfer Holder 1 Ultra Microtome 1 Leica GMP Plunge Freezing
Laser Milling, Ion Polishing and Specialty Prep 1 Gatan Illion Ion Etching System 1 Fischione 1050 Ion Mill* 1 Quorum Sputter Coater 1 Fischione 1051 Ion Mill* 1 Fischione 1040 Nano Mill* 1 Emitech Sputter Coater 1 Fischione Electropolisher 1 Denton Sputter Coater 1 Fischione 1070 Plasma Cleaner 1 MicroPrep Pro Laser Milling System 1 Leica TIC-3X Ion Beam Milling System
Scanning Electron Microscopy and Focused Ion Beam 2 Tescan Lyra FIB-SEMs* 1 FEI Nova FIB-SEM* 2 FEI Quanta Environmental SEMs* 1 Zeiss Gemini SEM*
1 TFS Apreo C SEM* 1 Hitachi TM3000 SEM 1 Cameca Electron Probe Microanalyzer 1 EDAX EDS System* 1 Bruker EBSD System* 2 EDAX EDS/OIM Systems* 1 Bruker EDS Systems* 1 EDAX EDS/OIM System 1 Omniprobe Autoprobe* 1 Nabity NPGS System 3 Oxford EDS Detector* 1 Oxford EBSD Detector*
Transmission Electron Microscopy 1 TFS Talos 200X TEM* 1 TFS Talos 200C TEM* 1 FEI Titan Field Emission Gun TEM* 1 Gatan K2 Imaging Filter* 1 Gatan Continuum-ER EELS System*
X-ray Diffraction and Computed Tomography 1 Rigaku Ultima X-Ray Diffractometer 1 Zeiss 810 Ultra X-Ray Tomography System*
*Maintenance agreement from OEM required
File details come from the government source that posted it. Updated .