Sources Sought Notice for CHIPS Semiconductor Electronics Test System

The National Institute of Standards and Technology (NIST) is seeking to procure a Keysight B1505A Power Device Analyzer/Curve Tracer Mainframe with integrated Source Measure Units for their CHIPS Act metrology research program. This sophisticated semiconductor electronics test system is designed to test two-dimensional and wide bandgap semiconductor materials, with capabilities including measuring power devices up to 10kV and 1600A, measuring capacitance with up to 3000V DC bias, and supporting high-power pulsed measurements to prevent device self-heating. The equipment will replace 30-year-old electronics and is critical for characterizing next-generation electronic materials to establish reliability limits and advance U.S. semiconductor manufacturing innovation. Quotations will be evaluated based on technical capability and price, with the award going to the lowest-priced, technically acceptable responsible offeror. The procurement includes a 5-year warranty with technical support, calibration services, and repair provisions, and electronic quotations must be submitted by 11:00 AM Eastern Time on September 12, 2025.

This procurement is designated as a 100% small business set-aside under NAICS code 334516 (Analytical Laboratory Instrument Manufacturing) with a size standard of 1,000 employees. The solicitation is structured as a brand-name only procurement specifically for Keysight equipment, consisting of four line items with a total quantity of one unit for each item: the B1505A Parametric Analyzer, a Precision SMU, FOB shipping, and transportation-related charges. The contract requires delivery within 6 weeks of order placement, with a total performance period of up to 15 weeks. Performance will take place at NIST's Boulder, Colorado location, and payment will be made 100% upon installation, acceptance, and successful demonstration of the system's performance capabilities. While specific award values are not disclosed in the solicitation documents, this represents a significant investment in advanced semiconductor testing capabilities for federal metrology research.