Scanning Electron Microscope

Awarded Award Notice Posted

Solicitation number
FA8126-17-R-0003
Agency
AFLCMC Tinker AFB Lifecycle Management Center, Department of Defense
Awarded
to Carl Zeiss Microscopy, LLC
Set-aside
No set-aside

Opportunity facts

Contract number
FA812617C0003 Federal contract award
NAICS code
334516 Analytical Laboratory Instrument Manufacturing
PSC
Not on record
Place of performance
Oklahoma City, Oklahoma 73145, United States

Notice details come from SAM.gov. Updated .

Notice text

2 versions

Update #2 · Latest ·

Added: Jan 20, 2017 10:47 am

The requirement has changed:

1.  From a ZEISS EVO-60 to a ZEISS EVO-MA-14
2.  Must include a gun source as LaB6

Update #1 ·

Added: Jan 11, 2017 4:25 pm  

The Government is conducting market research to identify potential sources that possess the technical data, expertise, capabilities, and experience to meet qualification requirements for the Government to purchase one (1) Zeiss Smart PI Scanning Electron Microscope, Install, Train, and provide PM service of the Zeiss Smart PI Scanning Electron Microscope.


 


The proposed acquisition effort is expected to be a Firm Fixed Price (FFP) contract consisting of a one year PM plan IAW FAR Part 12.  The contractor shall provide all labor, tools, equipment, test equipment, personal protective equipment and clothing, hearing protection, eye protection including prescription safety glasses, materials and parts, transportation and other incidentals necessary to travel to Tinker AFB, Oklahoma, to install, train, and perform PM on Zeiss Smart PI Scanning electron Microscope.  The contractor shall be responsible for insuring all services and parts provided under the proposed contract are in accordance with the terms and conditions of the proposed contract and conform to the manufacturer's equipment specifications, PWS, SOW, and the Contractor's Comprehensive Maintenance Agreement.


 


The Zeiss Smart PI Scanning Electron Microscope shall be installed and serviced IAW the procedures outlined in the Original Equipment Manufacturers' (OEM) technical data. No technical data is currently available; the Government does not own data rights or cannot obtain the data. The Government WILL NOT BE ABLE TO PROVIDE MANUALS OR DRAWINGS FOR THIS REQUIREMENT. All component parts shall be acquired from USAF approved vendors, Government inventory, OEM approved vendors, or commercial inventories including, but not limited to, Defense Logistics Agency (DLA). 

Attachments

Files attached to this notice, newest first
File Type Posted
SRC_Microscope_PWS_W.docx DOCX document
Sources_Sought_Synopsis-Zeiss_Smart_PI_Scanning_Electron_Microscope.docx DOCX document
SRC_Statement_of_Work_SmartPI.docx DOCX document

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
SEM Latest Award Notice
Scanning Electron Microscope This notice · Original Award Notice

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