Scanning Electron Microscope
Awarded Award Notice Posted
- Solicitation number
- FA8126-17-R-0003
- Agency
- AFLCMC Tinker AFB Lifecycle Management Center, Department of Defense
- Awarded
- to Carl Zeiss Microscopy, LLC
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- FA812617C0003 Federal contract award
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- Not on record
- Place of performance
- Oklahoma City, Oklahoma 73145, United States
Notice details come from SAM.gov. Updated .
Notice text
2 versions
Update #2 · Latest ·
Added: Jan 20, 2017 10:47 am
The requirement has changed:
1. From a ZEISS EVO-60 to a ZEISS EVO-MA-14
2. Must include a gun source as LaB6
Update #1 ·
Added: Jan 11, 2017 4:25 pm
The Government is conducting market research to identify potential sources that possess the technical data, expertise, capabilities, and experience to meet qualification requirements for the Government to purchase one (1) Zeiss Smart PI Scanning Electron Microscope, Install, Train, and provide PM service of the Zeiss Smart PI Scanning Electron Microscope.
The proposed acquisition effort is expected to be a Firm Fixed Price (FFP) contract consisting of a one year PM plan IAW FAR Part 12. The contractor shall provide all labor, tools, equipment, test equipment, personal protective equipment and clothing, hearing protection, eye protection including prescription safety glasses, materials and parts, transportation and other incidentals necessary to travel to Tinker AFB, Oklahoma, to install, train, and perform PM on Zeiss Smart PI Scanning electron Microscope. The contractor shall be responsible for insuring all services and parts provided under the proposed contract are in accordance with the terms and conditions of the proposed contract and conform to the manufacturer's equipment specifications, PWS, SOW, and the Contractor's Comprehensive Maintenance Agreement.
The Zeiss Smart PI Scanning Electron Microscope shall be installed and serviced IAW the procedures outlined in the Original Equipment Manufacturers' (OEM) technical data. No technical data is currently available; the Government does not own data rights or cannot obtain the data. The Government WILL NOT BE ABLE TO PROVIDE MANUALS OR DRAWINGS FOR THIS REQUIREMENT. All component parts shall be acquired from USAF approved vendors, Government inventory, OEM approved vendors, or commercial inventories including, but not limited to, Defense Logistics Agency (DLA).
Attachments
| File | Type | Posted |
|---|---|---|
| SRC_Microscope_PWS_W.docx | DOCX document | |
| Sources_Sought_Synopsis-Zeiss_Smart_PI_Scanning_Electron_Microscope.docx | DOCX document | |
| SRC_Statement_of_Work_SmartPI.docx | DOCX document |
Notice history
| Notice | Type | Posted |
|---|---|---|
| SEM | Award Notice | |
| Scanning Electron Microscope | Award Notice |
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