SEM
Awarded Award Notice Posted
- Solicitation number
- FA8126-17-R-0003
- Agency
- AFLCMC Tinker AFB Lifecycle Management Center, Department of Defense
- Awarded
- to Carl Zeiss Microscopy, LLC
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- FA8126-17-C-0003 Federal contract award
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- Not on record
Notice details come from SAM.gov. Updated .
Notice text
Added: Apr 26, 2017 11:16 am
The Contractor shall provide all labor, tools, equipment, test equipment, materials, parts, personal protective equipment (PPE), hearing and eye protection, transportation and other incidentals necessary to travel to Tinker AFB OK, for the delivery, installation, test of equipment, system certification, calibration, provide operator and maintenance (O&M) manuals, and training of personnel on the Zeiss EVO MA 15 LaB6 Scanning Electron Microscope (SEM) with SmartPI System. Any required maintenance shall be provided by Contractor as guaranteed in their one-year warranty. All services and parts are in accordance with the original equipment manufacturer (OEM) and are in accordance with (IAW) the terms and conditions outlined herein.
Sole Source: Zeiss, Inc
A Firm Fixed Price type contract is contemplated.
The estimated award date is 31 May 2017.
System for Award Management (SAM) is required to receive any award. Contractors can register electronically at https://www.sam.gov/portal/public/SAM/ . The NAICS code for this requirement is 334516 with a size standard of 1,000 employees.
Interested persons may identify their interest and capability to respond to the requirement by submitting a proposal. Electronic procedures will be used for this solicitation through FedBizOps at https://www.fbo.gov/. No telephone requests. See Note 22. Authority is 10 USC 2304 (c) (1).
For further information contact: Robin Adee, Contracting Officer, robin.adee@us.af.mil
Attachments
| File | Type | Posted |
|---|---|---|
| Redacted_J&A.pdf | ||
| FA812617C0003_Signed.pdf | ||
| Wage_Determination-2015-5315.pdf | ||
| FA812617R0003_Amendment.pdf | ||
| Performance_Work_Statement.pdf | ||
| FA8126-17-R-0003.pdf | ||
| Technical_Specifications_for_Zeiss_EVO_MA_15_LaB6_SEM.pdf | ||
| SEM_Statement_of_Work.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| SEM | Award Notice | |
| Scanning Electron Microscope | Award Notice |
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