JandA_scattering_ellipsometer_Redacted.pdf

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Abbreviated Justification and Approval Document

For Other Than Full and Open Competition of Requirements Greater than $150,000 Not Exceeding $650,000

(IAW FAR 6.304)

1. CONTRACTING ACTIVITY

Army Contracting Command-Aberdeen Proving Ground, Natick Contracting Division, ATTN: CCAP-SCN, General Greene Avenue, Natick, MA 01760

2. DESCRIPTION OF ACTION

Requirement: ✔ New Repeat

Pricing: ✔ Firm-Fixed Price Time & Materials Cost

Funds: OMA ✔ Other Funds:

Research, Development, Test and Evaluation

(RDT&E)

Name of Proposed Contractor: J. A. Woollam, Inc.

Street Address: 645 M Street, Suite 102 City, State, Zip: Lincoln, NE 68508 Phone: (402) 477-7501

3. DESCRIPTION OF SERVICES AND SUPPLIES

(Describe the services or supplies. Including make & model number to be acquired below.)

The estimated value of the proposed action is: $ 189,500.00

The U.S. Army Natick Soldier Research, Development and Engineering Center (NSRDEC) has a requirement for a complete turn-key Variable-angle Angle Spectroscopic Ellipsometer (VASE) from J. A. Woollam, Inc., which includes an autoretarder, operator computer, software, photomultiplier tube (PMT) Detector, Camera, and other accessories. The J.A. Woollam VASE system offers a very broadband spectral range (ultraviolet-visible-infrared light in the 280 nm to 3300nm range) for determination of optical indices of refraction and thickness of thin films, as well as a quantitative assessment, angle-dependent measurement of scattering power with a high signal-to-noise ratio; e.g., at least three-and-a-half orders of magnitude reduction in power below that of the specularly scattered beam. The J.A. Woollam VASE system has specialized silicon and PMT detectors, can illuminate a sample with angle-of-incidence up to 90°, has liquid cell accessories, sample rotation, and focused fiber light delivery. In additional to measuring standard optical parameters, critical to many NSRDEC optics programs, this instrument measures diffuse scattering, which gives many unique signatures and roughness information and is particularly relevant to NSRDEC's non-planar samples (e.g. non-wafer-based films made by roll-to-roll processes on plastic substrates, textiles, etc.).

This instrumental resource will enable the NSRDEC to conduct new research in the quantitative analysis of visible and infrared (beyond 3 micrometers in wavelength) optical properties, film thickness, surface roughness, and scattering/haze. The VASE will quantitatively characterize basic properties (thickness, optical/infrared constants, etc.) of constituent materials (polymers, liquid crystals, metals, etc.) over large areas, and then rough (e.g. film on plastic substrate, fiber) samples, which contain these materials.

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4. AUTHORITY CITED

(Identify the statutory authority, FAR title and FAR citation permitting other than full and open competition.)

10 USC 2304(c)(1) as implemented by FAR 6.302-1 – Only one responsible source and no other supplies or services will satisfy agency requirements.

5. REASON FOR AUTHORITY CITED:

Only the J.A. Woollam special high-sensitivity VASE ellipsometer system can satisfy the Government’s requirements, because it is unique in measuring both scattering and ellipsometry over the broadband ultraviolet-visible-infrared spectrum (due to its proprietary technology including very broadband sources, angle-of-incidence up to 90 degrees, focused fiber light delivery, multiple advanced (Si and PMT) detectors, and wide angle-of-incidence capability).

No other company sells instruments with both broadband ellipsometry and scattering measurements. Specifically, the VASE system is unique at measuring scattering intensity ~4 orders of magnitude less than that of the specularly-reflected beam and can measure optical indices of refraction, film thickness, and other optical properties over a uniquely broad spectral range of 240 nm – 3600 nm.

6. ADDITIONAL INFORMATION:

(i) What harm will come to the Government if desired supplies/services are not provided on time?

If the J.A. Woollam VASE ellipsometer system is not provided on time, key programmatic milestones on multiple NSRDEC programs will be missed and resources wasted. The impacted programs include: Nano-Enhanced Photovoltaics and Scattering in Polymers, Soldier Vision Protection and Enhancement, Transport of Chemical Warfare Agents, Thin-Film Supercapacitors for Integration with Uniforms and Equipment, and others. Also, if the desired research instrumentation is not provided on time, key personnel will be tasked on other programs and unable to use or learn the instrumentation, risking the possibility that the new instrumentation will be under-utilized.

(ii) What harm will come to the Government if desired contractor doesn’t receive the award?

Without this capability, NSRDEC will be denied the opportunity to obtain a transformative, “leap-ahead” resource to enable better in-house research, development, engineering, and training

– thus failing to achieve the goal of the NSRDEC Research Equipment and Instrumentation Proposal Program.

7. ACTIONS TO INCREASE COMPETITION:

State what actions will be taken to increase competition before subsequent acquisition of the supplies or services is required.

The NSRDEC pursues basic research in both optical scattering and optical materials, and as a result, investigates (through equipment shows at conferences/symposia, site visits, university partnerships, etc.) better ways to characterize (e.g., measure more accurately, measure over a wider angular range) both scattering and basic optical properties such as index of refraction, thin film interference, etc. Based on years of research and acquisition activities at NSRDEC and throughout the scientific, academic, and business environment via visits to conferences, vendors, Government and academic laboratories throughout the United States, J.A. Woollam, Inc. is the only source for a spectroscopic ellipsometer that can quantitatively measure scattering as well as carry out standard ellipsometry. No actions to increase competition are feasible, since J.A.

Woollam, Inc. is the only vendor that sells an advanced broadband large-angle-of-incidence ellipsometer, the VASE system, with the necessary functionality to measure a scattering signal

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3-4 orders of magnitude lower than the specularly reflected beam. The J.A. Woollam VASE system is the only spectroscopic broadband high angle-of-incidence scanning ellipsometer capable of such highly sensitive scattering measurements that will meet the Government's requirements.

8. MARKET RESEARCH

(Describe the extent of the market research conducted to identify all qualified sources and the results thereof. “Market Research” is defined as those attempts made to ascertain whether other qualified sources exist. Research of the market place may consists of written, telephonic, or world wide web inquires.)

This Government requirement results from a need for NSRDEC to conduct cutting-edge research in optical materials and optical scattering, therefore discussion of NSRDEC needs with experts in the field was critical to define requirements. Subject Matter Experts investigated multiple alternative companies’ products and other methods for obtaining a broadband ellipsometer that can 1) carry out quantitative analysis of visible and infrared (beyond 3 micrometers wavelength) optical properties, film thickness, etc. via ellipsometry and 2) measure scattering reduction with

3.5 orders of magnitude less than the specularly reflected beam. This investigation included years of speaking with scientific (academic and corporate) experts, attending trade shows at conferences, meeting with professors, postdoctoral associates, and students, reading and reviewing responses to Government (Broad Agency Announcements, Small Business, etc.)

solicitations, and internet/database searches. J.A. Woollam’s special high-sensitivity VASE system is the only instrument that has been found to be capable of carrying out both scattering and ellipsometry experiments over very broadband ultraviolet-visible-infrared spectrum with very large angles of incidence, focused beam, on liquid and solid cells.

J.A. Woollam, Inc. is generally considered the authority for professional ellipsometers in the and Woollam's combination of ellipsometer with scattering characterization is completely unique.

The other potential resources that have been revealed by the market research described above, and the reasons why these sources cannot meet the Government's requirements are as follows:

a. There are small firms like that sell ellipsometers, but these a have a more limited wavelength range and exclude the important infrared and ultraviolet regime.

b. There are laser-based scattering systems available

, but these are insufficiently broadband for Government requirements, and lack ellipsometry capability.

c. There are national labs with high-sensitivity instruments for characterizing scattering like

, but these instruments are not "turn-key" instruments, require users to support staff time, and do not have the needed broadband high-angle-of-incidence focused-light ellipsometer capability. A researcher/engineer can go there and carry out measurements, but that is impractical for the large group of potential NSRDEC users and would not further the goal of the Research Equipment and Instrumentation (REI) Proposal Program to enable a transformative or “leap-ahead” resource to greatly enhance in-house NSRDEC research and development.

d. Similarly, there are companies that can carry out limited-wavelength and limited-angle standard scattering measurements, but these are not broadband enough to satisfy Government requirements and does not satisfy the goals of the REI Proposal Program funding, which is to transform NSRDEC in-house research and development, and available funding is not purposed to pay for commercial services with funding approved for this REI purchase.

9. PROCUREMENT HISTORY:

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Previous Contract or Purchase Order Number: or ✔ N/A

Previously Competed? ✔ N/A No Yes

Previous authority for other than Full & Open Competition:

10. TECHNICAL / REQUIREMENTS CERTIFICATION:

I certify that the support data under my best cognizance which is included in this abbreviated-J&A is accurate and complete to the best of my knowledge and belief.

Submitted By: Dr. Richard M. Osgood III

Position Title: Research Physicist

Email Address: richard.m.osgood.civ@mail.mil

Date: 14 August 2015

11. FAIR AND REASONABLE COST DETERMINATION:

I hereby determine that the anticipated cost to the Government for this contract action will be fair and reasonable.

The techniques to be used to determine fair and reasonable prices are: price analysis.

As part of the basis, certified cost or pricing data will not be required.

If one of the exceptions in FAR 15.403 applies, please indicate.

Typed Name: Jean Greenwood

Date: 20 August, 20

Title: Contracting Officer

Signature:

12. CONTRACTING OFFICER'S APPROVAL

Based on the foregoing justification, I hereby approve the procurement of:

J.A. Woollam Variable-angle Angle Spectroscopic Ellipsometer (VASE) orderedunder the descriptionabove on another thanfull andopencompetitionbasispursuant to theauthorityof10USC2304(c) as implemented by FAR 6.302-1 , subject to availabilityof funds, andprovided that servicesandproperty hereindescribedhaveotherwisebeenauthorizedforacquisition.

Signature:

Contracting Officer Date: 20 August, 2015

GREENWOOD JEAN THIERFELDER 1278122189

c=US, o=U S Government, ou=DoD, ou=PKI, ou=USA, cn=GREENWOOD JEAN THIERFELDER 1278122189 2015 08 22 15:20:20 -04'00'

GREENWOOD JEAN THIERFELDER 1278122189

c=US, o=U S Government, ou=DoD, ou=PKI, ou=USA, cn=GREENWOOD JEAN THIERFELDER 1278122189 2015 08 22 15:22:11 -04'00'