Scanning Electron Microscope Acquisition - Microscopy Instrument

Closed Special Notice Posted

A newer solicitation was posted. See the latest solicitation from .

Solicitation number
4200697760Q
Agency
Shared Services Center National Aeronautics and Space Administration
Responses due
Set-aside
No set-aside

Opportunity facts

NAICS code
334516 Analytical Laboratory Instrument Manufacturing

Notice details come from SAM.gov. Updated .

Notice text

2 versions

Update #2 · Latest ·

Synopsis: 4200697760Q

NASA/NSSC has a requirement for Scanning Electron Microscope Acquisition - Microscopy Instrument.
NASA/NSSC intends to issue a sole source contract to JEOL USA, INC., 11 Dearborn Rd, Peabody, MA, 01960-3862 under the authority of FAR 13.106-1(b)(1)(i). It has been determined that JEOL USA, INC. is the sole provider of Scanning Electron Microscope Acquisition - Microscopy Instrument.
NASA/NSSC will be the procuring center for this effort. Performance will be located at NASA/ Marshall Space Flight Center (MSFC).
The Government intends to acquire commercial items and services using the provisions, clauses and procedures prescribed in FAR Part 12 and FAR Part 13.
The NAICS Code for this procurement is 334516.
Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 2:00 p.m. Central Standard Time on July 03, 2019. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the government.


Oral communications are not acceptable in response to this notice.


NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at http://prod.nais.nasa.gov/pub/pub_library/Omb.html .


Primary Point of Contact:
Bria Dixon
Procurement Specialist
Bria.A.Dixon@nasa.gov
228-813-6068



Secondary Point of Contact:
Karen Artis
Contracting Officer
Karen.L.Artis@nasa.gov
228-813-6323

.

Update #1 ·

Synopsis: 4200697760Q

NASA/NSSC has a requirement for Scanning Electron Microscope Acquisition - Microscopy Instrument.
NASA/NSSC intends to issue a sole source contract to JEOL USA, INC., 11 Dearborn Rd, Peabody, MA, 01960-3862 under the authority of FAR 13.106-1(b)(1)(i). It has been determined that JEOL USA, INC. is the sole provider of Scanning Electron Microscope Acquisition - Microscopy Instrument.
NASA/NSSC will be the procuring center for this effort. Performance will be located at NASA/ Marshall Space Flight Center (MSFC).
The Government intends to acquire commercial items and services using the provisions, clauses and procedures prescribed in FAR Part 12 and FAR Part 13.
The NAICS Code for this procurement is 334516.
Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 2:00 p.m. Central Standard Time on July 01, 2019. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the government.


Oral communications are not acceptable in response to this notice.


NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at http://prod.nais.nasa.gov/pub/pub_library/Omb.html .


Primary Point of Contact:
Bria Dixon
Procurement Specialist
Bria.A.Dixon@nasa.gov
228-813-6068



Secondary Point of Contact:
Karen Artis
Contracting Officer
Karen.L.Artis@nasa.gov
228-813-6323

.

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
Scanning Electron Microscope Acquisition - Microscopy Instrument Latest solicitation Solicitation
Scanning Electron Microscope Acquisition - Microscopy Instrument This notice · Original Special Notice

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