SOW_-_XRD_-_8-28-2018.DOC

Statement of Work For Thin Film and Powder X-Ray Diffractometer 1.0 Background 1.1 To facilitate analysis of electrodeposited HC chrome coatings on steel and powder samples the Government requires a complete thin film and powder x-ray diffractometer.

2.0 Purpose

2.1 This Statement of Work is to define the requirements and deliverables to be used in the selection and procurement of a Thin Film and Powder X-Ray Diffractometer to be installed at ARDEC’s Benét Laboratories (Bldg. 115). Installation will be performed by the system manufacturer.

3.0 Requirements

3.1 The contractor shall provide a complete Thin Film and Powder X-Ray Diffractometer with the following required minimum specifications:

3.1.1 Safety enclosure must comply with Machinery Directive 2006/42/EC and EC Directives 2006/96 EC. The instrument shall have clear visible lights indicating X-ray status.

3.1.1.1 The maximum radiation must be below 1 micro-Sievert/h under measurement conditions.

3.1.1.2 The system must be fully interlocked to ensure safe operation.

3.1.2 3 KW high stability, medium frequency high voltage power supply for the X-ray tube with a routine to automate burn-in of X-ray tubes to facilitate maximum tube lifetime.

3.1.3 Highly accuracy (0.005 deg.), high precision (0.0002 deg.), two-circle goniometer with independent stepper motors and optical encoders for the Theta and 2Theta circles.

3.1.3.1 Angular Range: 360 deg. (without accessories)

3.1.3.2 Usable Range: -110 deg. To 168 deg.

3.1.3.3 Smallest Addressable Increment: 0.0001 deg.

3.1.4 2.2 KW Cu X-Ray Tube must be capable of easily switching between line an point focus applications without disconnecting cables or unscrewing the X-Ray tube.

3.1.5 Slit assembly with 2.0, 1.2, 1.0, 0.6, 0.2, 0.1 mm slits, diagonal slit, axial Soller slit, UBC-Collimator, equatorial Soller collimator, Cu absorber, and Ni filter.

3.1.6 Rotating sample stage (0-168 deg. 2Theta in reflection mode, and -10-110 deg. 2Theta in transmission mode) with universal cup, alignment slit, and corundum sample.

3.1.7 Automated XYZ samples stage with travel of at least 25mm in X, 70 mm in Y, and 52 mm in Z and a maximum sample weight of 2kg.

3.1.8 Double-laser alignment unit with camera for alignment of a sample to the center of the goniometer.

3.1.9 Energy dispersive compound silicon strip detector with energy resolution of <380 eV, operating at room temperature.

3.1.9.1 Silicon Strip detector with 192 strips

3.1.9.2 Variable active detector window (14.4 mm x 16 mm total active window)

3.1.9.3 Variable sample to detector distance

3.1.9.4 Maximum global count rate >100,000,000 cps

3.1.9.5 Operation with all common X-ray lines

3.1.9.6 Spatial resolution of 75 microns

3.1.9.7 Energy resolution <380 eV for Cu radiation at 25 C

3.1.10 Any refrigerated chiller required for operation.

3.1.11 Analysis workstation with all requires software licenses.

3.1.11.1 Workstation shall include all required components for operation, including but not limited to computer and monitor.

3.1.11.2 Software must be capable of full instrument control, data analysis, and data archiving. Software in combination with the workstation must allow for complete stand-alone system operation.

3.1.11.2.1 Instrument control software must provide complete control over all acquisition parameters.

3.1.11.2.2 Analysis software must allow for peak searching, manual and fully automated background subtraction, data smoothing, K-alpha2-stripping, 2Th-offset and sample displacement corrections, calculation of mass absorption coefficients and corresponding X-ray penetration depth, calculation of profile parameters, crystallite size determination, support simultaneous evaluations of multiple scans, search reference databases (including user provided ICDD),

3.1.11.3 Software licenses: One (1) instrument control license and two (2) data analysis licenses are required.

4.0 Installation

4.1 On-site installation will be performed by the manufacturer at ARDEC-Benét Laboratories located at Watervliet Arsenal, NY, 12189.

5.0 Training

5.1 The contractor shall provide training for at least one ARDEC-Benét employee on all modes of operation and any required instrument maintenance. Training may be conducted at the vendor’s site or the customer’s site.

5.2 The contractor may use MIL-HDBK-29612-2A - Department of Defense Handbook, Instructional Systems Development/Systems Approach to Training and Education (Part 2 of 5 Parts), 31 August 2001 as guidance for the development of training instruction (e.g., materials and a briefing), training criteria (e.g., desired learning outcomes and performance goals), and evaluation methods and metrics to verify training effectiveness in accordance with criteria (e.g., performance measurements such as number of tasks correctly completed within a prescribed time and/or an acceptable error rate).

6.0 Warranty

6.1 The Contractor shall offer a standard commercial warranty, including onsite service warranty on labor, parts, and materials for a minimum period of one (1) year from the date of installation on the complete instrument and a five (5) year warranty on the goniometer.

7.0 Preventative Maintenance

7.1 The Contractor shall provide one (1) preventative maintenance visit during the warranty period. The service engineer will inspect, clean, make minor adjustments, verify the operation, and perform general systems tests.

8.0 Written Deliverable

8.1 The Contractor shall provide written certification that the installed instrument meets the quoted specifications IAW DI-MISC-81356A.

9.0 General Requirements and Information 9.1 The period of performance of the contract shall commence upon award of the contract and shall be completed upon delivery and installation of the Thin Film and Powder X-Ray Diffractometer and applicable training, which shall occur within 120 days from award of the contract.

9.2 The instrument shall be delivered to:

Joshua A. Maurer

US Army ARDEC – Benét Laboratories

RDAR-WSB-LB

Building 115

Watervliet, NY 12189

Phone (518) 266-5575

Email: joshua.a.maurer4.civ@mail.mil