Statement_of_Requirements_-_Atomic_Force_Microscope.docx

Statement of Requirements for the Purchase of an Atomic Force Microscope (AFM):

1.0 AFM Requirements

The following describes the requirements for the purchase of a “TURN KEY” Automated Atomic Force Microscope (AFM) with integrated vibration isolation tables or stands and the ability to acoustically isolate samples. The requirements are broken into 3 sections. 1) Probe Station, 2) AFM Imaging and Testing Modes, 3) Sample Environment.

1.1 Probe Station (PS) and Environmental Control Unit (ECU)

1.2 The PS shall have automatic tuning functions which monitor samples, scan area, scanner, and cantilever and determines the best operating conditions and automatically optimizes operator parameters in one of its fundamental imagining modes.

1.2.1 The PS shall have Contact mode, Tapping (Dynamic) with a Q-control Method, and Scanning Tunneling Mode and an intermittent imagining mode which controls the tip-sample imagining force to 50pN minimum at a imagining rates less than 10 minutes per image. The PS shall have the ability either through software hardware or both to accommodate for lateral tip/software interactions.

1.2.2 Advanced image mode to eliminate friction force effects for both topographic and physical properties for both contact and tapping modes.

1.3 Samples Size: The sample size shall fit within 25 mm minimum and be a thickness of 10 mm minimum.

1.4 The PS and ECU shall have a single scanner or interchangeable scanners with the following XYZ Scan range of 90 micrometers x 90 micrometers x 10 micrometers minimum.

1.5 Integrated optical microscope with a minimum zoom ratio of x7 minimum alternatively video optics with a 5-megapicle digital camera covering a viewing minimum viewing range of 150 micrometers to 1400 micrometers.

1.6 The AFM shall provide hardware and software to conduct Qualitative and Quantitative Mapping of Mechanical properties including modulus, adhesion and sample deformation at resolution greater than 10 nm, and at conventional AFM imaging rates for Polymeric and Metallic Materials over a modulus range of 0.5 kPa to 50 GPa minimum.

1.7 The AFM shall have the ability to measure Modulus extending from soft sticky hydrogels and composites to stiff metal and ceramics 102 Pa all the 1012 Pa. The contractor shall provide the following “starter probes”

1.7.1 a low nominal 0.25 N/m spring constant probe suitable for extremely soft polymer samples (typical in kPa to MPa range)

1.7.2 A moderately low nominal 5 N/m spring constant probe suitable for soft polymer (typical in MPa range).

1.7.3 A high nominal 40N/m spring constant probe suitable for for stiff (typically GPa) samples.

1.7.4 A very high low nominal 40N/m spring constant probe suitable for very stiff (typically >> 1 GPa) samples.

1.8 The contractor shall provide a minimum of 30 spare probes; the stiffness range of the probes shall be determined prior to delivery.

1.9 The contractor shall provide the hardware and software needed to run following additional modes. At a minimum 1 additional probe tip, for each mode shall be provided with the system.

1.9.1 Magnetic Force Microscopy.

1.9.2 Kelvin Force Microscopy in both amplitude and frequency modulation with simultaneous nano-mechanical mapping.

1.9.3 Electrostatic Force Microscopy (AC and DC)

1.9.4 Piezo – Response Microscopy

1.9.5 Liquid Imagining mode

1.9.6 Conductive Mode in either contact or intermittent contact mode with simultaneous nano-mechanical mapping.

1.9.6.1 Amplifiers for current measurement ranges Current measurement range of +/- 100 nA and current measurement range of +/- 100pA

1.9.7 Liquid Imaging Mode

1.9.8 Adhesion Mode

1.9.9 ViscoElastic Mode - Qualitative and Quantitative mapping and measurement of visco-elastic properties (i.e. Loss Modulus, Storage modulus and tan-delta) as function of both temperature and frequency. Temperature range shall be in the range of the instrument’s Temperature control. Spatial resolution shall be less than 100 nm.

1.9.10 Scanning Tunneling Mode

1.9.11 The contractor shall provide an AFM that is capable of running the following sample Environments

1.9.11.1 Temperature control: minimum temperature -35 oC to maximum temperature to 250 oC minimum

1.9.11.2 Humidity Control from 10% to 80% (minimum range) relative humidity.

1.9.11.3 Additional atmospheric gas control inputs for cover and reactive gasses such as Nitrogen, Argon, Oxygen, etc.

1.9.11.4 Liquid Imaging.

2.0 The contract shall provide onsite support and installation and training. Training shall include an additional 3 days six months after installation.

3.0 The contractor provide shipping to the following Address:

6501 E. 11 Mile Road Warren, MI 48397-5000 Building 200D-Metallurgy Laboratory

4.0 Security requirements:

4.1 At all times the vendor will be accompanied by a GVSC employee and will not be reviewing, handling, or in contact with any classified, sensitive, or FOUO information or materials. The vendor personnel will not have a security clearance and will not need one. The vendor personnel will not need a CAC card or any access to computer networks (NIPR or DREN). The vendor will be working on a standalone laptop that was configured specifically for this application, which will not contain any classified, sensitive, or FOUO information on it. The vendor personnel will only require a day pass to access the Detroit Arsenal. The vendor personnel shall be a US citizen.

4.2 AT Level I Training - This training in not required

4.3 Access and General Protection/Security Policy and Procedures - The contractor shall provide all information required for background checks to meet installation access requirements to be accomplished by the installation Security office. The contractor workforce must comply with all personal identity verification requirements (FAR clause 52.204-9, Personal Identity Verification of Contractor Personnel) as directed by DoD, HQDA, and/or local policy. In addition to the changes otherwise authorized by the change clause of this contract, should the Force Protection Condition (FPCON) at any individual facility or installation change, the Government may require changes in contractor security matters or processes.

4.4 Access to Government Information Systems - No access to government information systems will be required.

4.5 Information Assurance (IA)/Information Technology (IT) Training - No access to government information systems will be required.

4.6 U.S. Government Common Access Cards, installation badges, and/or access passes - No Common Access Cards or Permanent installation badges will be required. A day access pass will be the only thing required to complete this contract.

4.7 Contracts That Require Handling or Access to Classified Information - No access to classified information will be required.