SATPC0030676 Tab 04 SOW.pdf

Technical Requirements for Upgrade to X-Ray Photoelectron Spectrometer (XPS) System

This package removes a large part of the electronics of the VersaProbe I to allow the implementation of many software and hardware features of the VersaProbe II. The VersaProbe I will be deemed obsolete by instrument manufacturer at the end of 2024 and will no longer be supported by a service contract.

Listed are the key features and changes gained from the upgrade:

Update Details

• VersaProbe I card racks removed and replaced with VersaProbe II electronics

• New Intro Camera and necessary brackets installed

• New State of the art Windows 10 computer

• Latest version of SmartSoft

• Latest version of MultiPak

• Sample holders will not change

- Maximum sample holder size is 60mm

• Resets the age of the system with reduced cost service contract

SmartSoft UserInterface

• Greatly improved user interface

• More automated transfer process

• Organized workflow

• Integrated platen management

• Intuitive queuing for improved multi sample automated analysis and higher throughput

• Stored recipes and analysis locations

• Improved point and click navigation on SXI image

• Point and click navigation on optical image

• Real-time multi-level system status logging and error reporting

• Enhanced service tools

• Software controlled analyzer calibration

• Multilevel system status logging

New Introduction Camera

• DSLR camera image with digital zoom

• Navigation is much easier

• Side-by-side view with SXI

• Drop analysis points right on optical image

Performance Changes

• 128 Channel detection Provides excellent chemical state mapping capability Improves depth profiling capabilities This capability improves data quality and can be achieved in a fraction of the time.

• New electronics Improves system/electronic overhead for increased acquisition speed Service diagnostics are markedly improved with electronic/software system status and error reporting.

• Constant pressure Ar leak for monoatomic ion gun (fixed leak valve option)

Enables shorter and more stable sputter intervals during depth profiling