Statement_of_Work_(Potentiostat).docx

Statement of Work NAVAIR Patuxent River 4.3.4.6. Corrosion and Wear Lab Potentiostat for Electrochemical Experimentation Location:

Materials Engineering Division NAVAIR 4.3.4.6 – Corrosion and Wear Branch Corrosion and Wear Lab – Room 206 48066 Shaw Road Unit 5 – Building 2188 Patuxent River MD, 20670-1908 TPOC – Victor Rodriguez-Santiago (301-342-8040) (victor.rodriguezsant@navy.mil) Alt. POC – Kevin Cook (301-342-5314) (kevin.m.cook1@navy.mil) Alt. POC – Joseph Ullmann (301-342-8060) (joseph.ullmann@navy.mil) Equipment Needed:

A modular tabletop Potentiostat/Galvanostat/electrochemical impedance spectroscopy (EIS) analyzer, compatible scanning kelvin probe, and all additional equipment necessary to meet or exceed the following technical requirements. Shipping, Installation, Warranty, and Training for all equipment shall be included.

· A single chassis Potentiostat unit that shall accommodate a total of 16 modular Potentiostat/Galvanostat/frequency response analyzer (FRA) boards (channels) in any configuration.

· Shall be capable of operating in either a floating or grounded mode.

· All software shall be compatible with Windows 7 64-Bit.

· The chassis unit shall be capable of communicating with a computer via USB and Ethernet

· Self-calibration shall be capable without the need of additional hardware.

· Any two channels shall be capable of bipotentiostat functionality. The two channels shall operate independently, but can be synchronized.

· Shall be capable of analog filtering at 50 kHz, 1 kHz and 5 Hz

· A total of fourteen (14) Potentiostat/Galvanostat boards with EIS capability

· Compatible impedance-capable boards shall be available for future purchase from the same original equipment manufacturer (OEM).

· Shall be capable of simultaneous current and voltage measurement.

· A standard board (channel) shall have a compliance voltage (without additional booster boards) of +/- 12 volts.

· Shall be capable of reference voltage adjustment between +/- 10 volts.

· Shall be capable of controlling measurement resolution from 300 μV down to 1 μVShall be capable of applying and measuring currents from 1 pA to 500 mA with a current control resolution of 0.004% of the selected current range.

· Channels shall be capable of data acquisition at 20 μS.

· Shall be capable of impedance measurements between 10 uHZ to 7 MHz without the need for an additional analyzer.

· Shall be compatible with current booster boards up to 10 Amps.

· Shall be compatible with an optional linear scan generator for analog waveform applications.

· A low current channel option shall be available to allow for 76 aA resolution.

· The user shall be capable of adjusting the operating bandwidth to ensure stability.

· Shall include an internal coulometer.

· Shall be capable of feedback iR compensation.

· A total of fourteen (14) cell cables that include integrated ultra-low current electrometers.

· Shall be capable of <100 fA measurement accuracy with 76 aA resolution

· Electrochemistry software package.

· Shall be compatible with Windows 7 64-bit

· Digital filtering functionality shall be available.

· Shall include techniques for (but not limited to) the following electrochemical applications:

· Corrosion techniques

· Impedance

· Battery test protocols

· Fuel cell and Solar PV development

· Voltammetry techniques

· Modular waveform generation with special “Technique Builder” applications Software updates shall be available at no charge

· Shall be capable of feedback iR compensation.

· A single chassis (separate from the 16-channel Potentiostat unit) containing a Modular Scanning Kelvin Probe

· Shall be capable of any combination of the following measurement techniques:

· Scanning Electrochemical Microscopy (SECM)

· Alternating Current Scanning Electrochemical Microscopy (ac-SECM)

· Intermittent Contact Scanning Electrochemical Microscopy (ic-SECM)

· Local Electrochemical Impedance Spectroscopy (LEIS)

· Scanning Vibrating Probe (SVP)

· Scanning Kelvin Probe (SKP)

· Scanning Droplet System (SDS)

· Alternating Current Scanning Droplet System (ac-SDS)

· Non-Contact Surface Profiling (OSP)

· Shall include an environmental cell for use with SVP/SKP/LEIS techniques.

· All control and data analysis software shall be compatible with Windows 7 64-Bit.

· All software and hardware shall be compatible and interoperable with the Potentiostat/Galvanostat system.

· Shall include an X/Y/Z positioning motor and mounting system with the following features:

· Scan range of 100 mm or greater.

· X/Y/Z axis resolution of 20 nm or less.

· Maximum scan speed of 10 mm/s or greater.

· Measurement is capable of 32-bit decoding at up to 40 MHz.

· Included software shall be capable of and or include:

· X and Y curve substraction (polynomial up to 5th order).

· 2D and 3D fast-Fourier transform (FFT).

· Auto sequencing of experiments, probe movement and area mapping.

· Advanced peak analysis tool.

· Fully programmable macro language.

· Advanced topography analysis tools including a full suite of roughness parameter calculations and tilt/curvature removal.

· A Standalone Control Computer

· This computer shall be preconfigured with all software needed to operate the Potentiostat and SKP systems.

Estimated Delivery Date April 30st 2016