A1.5 REQUIREMENTS AND SPECS.pdf

Multiferroic Test System Requirements and Specifications

Voltage = 120 VAC

Required to conform to U.S. electrical standards and to facilitate connection to wall power.

Power ≤ 400 W Based on need to conserve energy and minimize heat load to the room.

Frequency = 60 Hz Required to conform to U.S. electrical standards.

Measurement type includes electrical hysteresis, capacitance vs voltage, PUND, fatigue test, leakage current, piezoelectric response, magnetoelectric response

PUND: "Positive Up, Negative

Down" hysteresis measurement.

Piezoelectric and magnetoelectric response measurements require separate test fixtures used in concert with the multiferroic tester.

Required to measure the ferroelectric, piezoelectric, and magnetoelectric properties of research samples.

Internal drive voltage minimum range of ± 500 VDC

Drive voltage is to be provided by the multiferroic tester, not by an external source.

Required to minimize electrical hazard risk to the operator.

Minimum hysteresis frequency ≤ .05 Hz

Maximum hysteresis frequency

250 kHz (@ up to ± 100 V)

5 kHz (@ ± 500 V)

Minimum pulse width ≤ 500 ns

Maximum pulse width ≥ 800 ms

Required to enable complete characterization of the ferroelectric, piezoelectric, and magnetoelectric properties of research samples.

Electrical

Requirement

JustificationConditions / Comments

Comparison to

Requirement

Minimum

RequirementCategory

Attribute /

Capability

Single phase power. Requirements apply to all powered components of multiferroic test system. Power requirement is the total power for the multiferroic test system as a whole.

Multiferroic

Tester

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Electrical

Requirement

JustificationConditions / Comments

Comparison to

Requirement

Minimum

RequirementCategory

Attribute /

Capability

Single phase power. Requirements apply to all powered components of multiferroic test system. Power requirement is the total power for the multiferroic test system as a whole.

Sample length minimum range of

Sample width minimum range of

Sample thickness minimum range of 0.01 to 0.04 in.

Sample weight NR

Footprint ≤ 15 in. x 15 in.

Required to minimize the lab bench space taken up by the probe station.

Sample chuck size ≥ 2 in. x 2 in.

Required to accommodate size of research samples.

Sample hold-down is by vacuum chuck Required to enable convenient mounting/dismounting of samples.

minimum range of ± 0.5 in. As measured from chuck center.

resolution at least 0.001 in.

Probe type includes DC and RF probing DC: direct current

RF: radio frequency

Required to enable complete characterization of the ferroelectric, piezoelectric, and magnetoelectric properties of research samples.

Probe hold-down is by vacuum or magnetic clamping

Probe X/Y/Z positioning minimum range of 0.5 in. Positioning range for each direction.

Vacuum pump is included Pump is to be oil-free.

Required to provide sample and probe hold-down functions.

Microscope type is stereo zoom type Binocular or trinocular; trinocular preferred.

Microscope magnification minimum range of 7X to 25X Continuously adjustable.

Sample illumination is ring type With continuously variable intensity.

0.4 to 2 in. Includes non-circular substrates and wafer pieces a small as 0.4 in. ×

0.4 in., and circular wafers with up to

2 in. diameter.

Research processes require samples with this range of sizes.

Chuck positioning Required to enable convenient probing of samples.

Required to properly illuminate sample to enable sample examination and probe positioning.

Required to enable convenient positioning of probes.

Test Sample

Probe Station

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Electrical

Requirement

JustificationConditions / Comments

Comparison to

Requirement

Minimum

RequirementCategory

Attribute /

Capability

Single phase power. Requirements apply to all powered components of multiferroic test system. Power requirement is the total power for the multiferroic test system as a whole.

Measurement type includes cantilever displacement vs voltage, piezoelectric coefficient d31, piezoelectric stress constant e31

For use with the multiferroic tester.

The e31 measurement may require the use of interdigitated electrodes.

minimum range of 0.2 in.

resolution at least 0.0001 in.

Measurement type includes magnetoelectric response, magnetic field dependence of:

polarization hysteresis, remnant hysteresis, small-signal capacitance, PUND, conductance, current vs voltage characteristic

For use with the multiferroic tester.

DC magnetic field minimum range of ± 40 Oe

Magnetic field value must be continuously variable within the supplied range.

Contol and

Analysis Software is included

Must run under 64-bit Windows 10, and be provided by CD, DVD, or download. The computer on which the software is to be run is not included as part of this procurement.

Required to control the tester instrument, and to collect/ record/analyze the measured data.

Miscellaneous

Warranty is included

Manufacturers warranty (of at least 1 year duration) covering any repair or replacement needed due to parts failure or manufacturing defects (for all components and for the system as a whole).

Required to protect the government's investment against equipment failure.

Magnetoelectric

Test Fixture

Required to measure the listed properties of test samples in the presence of a magnetic field.

Displacement sensor

Required to measure the piezoelectric parameters of piezoelectric films deposited on cantilevers or of bulk piezoelectric cantilevers.

Piezoelectric

Test Fixture

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