69-1305-17_AFM_minimum_technical_specifications.docx

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Atomic Force Microscope
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N00173-17-R-ST02
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MINIMUMTECHNICAL SPECIFICATIONS

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Bio AFM minimum technical specification

· High resolution Atomic Force Microscope (AFM) imaging capability in air and fluid

· Low interaction force enable tapping mode – capable of interacting with soft materials without damaging the delicate surfaces

· Contact mode

· Tapping mode

· Integrated with inverted light microscope TiU from Nikon

· Base Plate for Operation with Nikon Eclipse TI Inverted Light microscope

· Suitable for measuring cells up to 15 um thick

· Suitable for measuring proteins, DNA, other biological nanomaterials down to 2nm lateral dimension and sub-nanometer resolution

· Measures topography of mixed materials, inorganic nanoparticles with biological nanomaterials

· Interrogates structural properties of the biological surfaces using force spectroscopy methods

· AFM capabilities combined with inverted microscope to allow for localization and concurrent imaging of cellular samples

· AFM microscope and inverted optical microscope are fully integrated and integral to the operation of the instrument

· High speed imaging tapping mode suitable for high throughput sample measurement and kinetic assay of cells

· Piezo driven scan stage with 100um range

· Motorized stage with 10mm range

· External tip alignment module

· Sample heater up to 40°C during imaging

· Micro volume fluid cell that allows for a sealed fluid environment of no more than 100uL and allows for fluid exchange with integrated inlet and outlet ports – capable of long-term live cell studies

· Nanomechanics software package that can measure modulus, stiffness, and adhesion

· Software running on windows 7 minimum with a LCD screen large enough for multi-user viewing (24” or greater)

· Automated image optimization software for facilitating the multi-user instrument

· Optical image integration with AFM navigation

· Sample holder suitable for low noise imaging (sub-nm resolution)

· Voltage 100-120V

· Top view optics for imaging of opaque samples - optics does not add to instrument noise

· Integrated acoustic isolation system

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