Inquiry of Availability.docx

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NanoMagnetic Instruments High Resolution Scanning Probe Microscope System
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N00173-21-Q-0333
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Inquiry of Availability If quoting NanoMagnetics, include Authorized OEM Reseller letter.

If quoting equivalent, include Specification with Quote

ITEM
DESCRIPTION

QUANTITY

1
NanoMagnetics Instruments

High Performance Scanning Tunneling Microscope hpAFM with STM

· Minimum <25 fm/Hz½ noise floor

· 24 bit 100x100x15 μm XYZ scanner

· Atomic resolution

1EA

2
Motorized Coarse and Fine Approach

· Z-direction: minimum 50 mm range, 250 nm resolution

· X-Y direction: minimum 76 mm range, 50 nm resolution

1EA

3
Standard Microscopy Modes

· Scanning Tunneling Microscope

· Contact mode

· Dynamic Force / Intermittent Contact / Tapping Mode

· Lateral Force Microscopy (LFM)

· Phase Imaging

· Electric Field Microscopy (EFM)

· Force-distance Spectroscopy

1EA

4
AFM Control Software

· Up to 8192 X 8192 pixels imaging

· Slope correction

· Thermal drift compensation

1EA

5
Controller Electronics

· Frequency Range : 100Hz – 1MHz

· Resolution : 40nHz

· Demodulation Bandwidth: 50Hz – 5kHz

· LabView drivers

1EA

6
User Kit

1EA

7
Video Microscope

· Minimum 8 MP CMOS camera

· Motorized Optical zoom x1-5

· Minimum 1 μm optical resolution

· 10x long working distance objective

1EA

8
Acoustic, Thermal and Vibration Isolation

· Vibration isolation platform with acoustic enclosure design

· Acoustic/Thermal isolation cabinet, opening sideways for safety and ease of operation

1EA

9
Computer

1EA

10
Heating Stage

· Temperature range: room temperature to +120°C

1EA

11
Commissioning, Installation, Training On-Site

1EA

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