2024 MSTD Analytical SEM Performance Specification - April 2024.pdf
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- Scanning Electron Microscope (SEM)
- Solicitation number
- Not on record
- Issued by
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Department of Energy
About this file
This document is a performance specification for a Scanning Electron Microscope (SEM) equipment purchase. The Company is seeking to acquire an SEM with advanced analytical capabilities, including Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Wavelength Dispersive Spectroscopy (WDS). The specification outlines detailed technical requirements for the SEM, such as resolution, accelerating voltage, beam current range, magnification range, and various detector types. Additionally, it includes requirements for peripheral equipment, such as a chamber camera, plasma cleaner, and retractable low vacuum stage. The delivery of the SEM must be made on or before September 25, 2024, and the purchase price must include all shipping, transportation, surveys, tariffs, and training costs.
The related federal contract opportunity is a solicitation for a Scanning Electron Microscope (SEM) equipped with material characterization tools, as described in the attached performance specification. The solicitation is issued by the Department of Energy, and the opportunity type is a solicitation.
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Other files
| File | Type | Posted |
|---|---|---|
| RFP No. PR 270543.pdf |
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The Company is seeking to purchase a Scanning Electron Microscope (SEM) equipped with material characteriza�on tools such as Energy Dispersive Spectroscopy (EDS), Electron Backscater Diffrac�on (EBSD), and Wavelength Dispersive Spectroscopy (WDS). Each of the following technical capabili�es for this new analy�cal SEM must be included to support and expand analy�cal capabili�es.
1. SEM – Scanning Electron Microscope
a. Resolu�on at least 0.5nm, 0.7nm, and 0.9nm at 15kV, 1kV, 0.5kV respec�vely
b. Accelera�ng voltage at least 0.01 to 30kV
c. Beam Current range 1pA to >500nA
d. Magnifica�on Range at minimum 10X to 2MX.
e. So�ware/PC Hardware – montage capability
f. Schotky in-lens thermal field emission gun
g. Solid state retractable backscater electron detector: at least 1.3nm resolu�on at 30kV
h. Detectors: E-T type secondary electron detector,
i. In-column Probe Current Detector
j. Retractable Transmission Electron Detector
k. Stage: Mechanical �lt to 70 degrees, eucentric goniometer stage travelling at least
100x100mm
l. Total of 6 imaging detectors.
2. Peripherals:
a. chamber camera
b. Plasma cleaner or decontamina�on system.
c. retractable low vacuum stage
3. EDS – Energy Dispersive Spectroscopy
a. So�ware – acquire simultaneously with WDS, create montage
b. Minimum 170mm^2 Silicon Dri� Detector Surface Area
4. EBSD – Electron Backscater Diffrac�on
a. CMOS - ~5700pps
b. Opera�onal and Analysis So�ware
c. Safety Interlock System
d. Color forward scatering detector
5. WDS – Wavelength Dispersive Spectroscopy
a. Opera�onal and Analysis So�ware
b. Integrated to SEM, motorized gate-valve
c. Detect less than 0.2 wt% trace elements
d. 2theta of 33 to 135 degrees, quant range Be to Pu, dual propor�onal counters
e. Addi�onal LiF detector crystal, addi�onal detector crystal op�mized for carbon.
f. 7 crystals total.
6. Cathodo-Luminescence (CL) Detector
7. Field Cancella�on System
8. Ac�ve Vibra�on Isola�on System
9. NRTL Approved
a. Must include report
10. Purchase price must include all shipping and transporta�on costs, required surveys, tariffs, and training.
11. Delivery must be made on or before 09/25/2024.
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