XAFS and Diffraction, Silicon Drift Detector , Hitachi Vortex ME-7 STD SDD or equal
Closed Solicitation Posted
This opportunity was awarded. See the award notice from .
- Solicitation number
- 1333ND24QNB030198
- Agency
- National Institute of Standards and Technology Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Gaithersburg, Maryland 20899, United States
- Points of contact
-
- Joni L. Laster joni.laster@nist.gov (301) 975-6205
- Donald Collie donald.collie@nist.gov (301) 975-6458
Notice details come from SAM.gov. Updated .
About this opportunity
The Department of Commerce National Institute of Standards and Technology (NIST) is seeking to procure a new, seven-element silicon drift detector (SDD) system for use in X-ray Fluorescence (XRF) spectroscopy and fluorescence X-ray Absorption Spectroscopy (XAS) at the National Synchrotron Light Source II. NIST is seeking a Hitachi Vortex ME-7 STD SDD or an equal product that meets specific technical requirements such as energy resolution, detector area, and compatibility with NIST's existing detector readout system. The evaluation will be based on the lowest priced, technically acceptable offer, with proposals due by April 26, 2024.
This is an unrestricted solicitation, with a NAICS code of 334516 - Analytical Laboratory Equipment Manufacturing. The period of performance is 40 weeks, with 24 weeks for system delivery, 12 weeks for installation and facilitization, and 4 weeks for commissioning. Delivery is required to be FOB Destination, and payment will be 100% upon final acceptance. The place of performance is Gaithersburg, MD 20899, USA.
Notice text
2 versions
Update #2 · Latest ·
AMENDMENT I:
The purpose of this amendment is to revise the technical specification for the window and to revise the required delivery timeline.
Please see the revised statement of work for the complete details. The due date for quotes remains unchanged.
XAFS and Diffraction, Silicon Drift Detector , Hitachi Vortex ME-7 STD SDD or equal per the attached requirements
Update #1 ·
XAFS and Diffraction, Silicon Drift Detector , Hitachi Vortex ME-7 STD SDD or equal per the attached requirements
Attachments
| File | Type | Posted |
|---|---|---|
| SOW Revised.docx | DOCX document | |
| SOW.docx | DOCX document | |
| 1333ND24QNB030198.docx | DOCX document |
Notice history
| Notice | Type | Posted |
|---|---|---|
| XAFS and Diffraction, Silicon Drift Detector , Hitachi Vortex ME-7 STD SDD or equal | Award Notice | |
| XAFS and Diffraction, Silicon Drift Detector , Hitachi Vortex ME-7 STD SDD or equal | Solicitation |
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