Source Sought: High-Precision Stage for Nanoscale X-ray Tomography

Closed Pre-Solicitation Posted

This opportunity was awarded. See the award notice from , or the latest solicitation from .

Solicitation number
NIST-SS24-CHIPS-0027
Agency
National Institute of Standards and Technology Department of Commerce
Responses due
Set-aside
No set-aside

Opportunity facts

NAICS code
334516 Analytical Laboratory Instrument Manufacturing
PSC
6640 Laboratory Equipment And Supplies
Place of performance
Boulder, Colorado 80305, United States

Notice details come from SAM.gov. Updated .

About this opportunity

This Sources Sought Notice seeks a high-precision stage solution for nanoscale x-ray tomography to be used by the National Institute of Standards and Technology. The stage must fit within a 175mm radius by 300mm height cylinder and operate in a high vacuum environment, with rotational motion within 120 degrees, 150um fine motion ranges, 20mm coarse motion ranges, and positional drift of less than 50nm per minute. Responses are due by March 11, 2024 and will be evaluated based on equipment specifications and capabilities, customization options, pricing, terms and conditions.

There is no set-aside designation. Key details include rotational and translational motion requirements within the specified dimensions to function in a high vacuum environment. Responses should include all relevant technical and pricing details to support an appropriate solicitation of this requirement.

Notice text

NIST is seeking information from sources that may be capable of providing a solution that meets or exceeds the requirements in the attached Sources Sought Notice# NIST-SS24-CHIPS-0027.

Attachments

Files attached to this notice, newest first
File Type Posted
NIST-SS24-CHIPS-0027.pdf PDF

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
High-Precision Sample Positioning Stage - Award Notice Award Award Notice
High-Precision Sample Positioning Stage - Combined Synopsis/Solicitation Latest solicitation Solicitation
Source Sought: High-Precision Stage for Nanoscale X-ray Tomography This notice · Original Pre-Solicitation

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