Scanning Electron Microscope for X-ray Tomography
Closed Pre-Solicitation Posted
This opportunity was awarded. See the award notice from , or the latest solicitation from .
- Solicitation number
- NIST-SS24-CHIPS-0026
- Agency
- National Institute of Standards and Technology Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Boulder, Colorado 80305, United States
Notice details come from SAM.gov. Updated .
About this opportunity
NIST seeks information from potential vendors for a scanning electron microscope to be used in x-ray tomography applications. The required system must meet minimum specifications including a high vacuum chamber compatible with external detectors, an electron column providing 3-30kV acceleration and 20-100nA beam current with sub-micron stability, and external control including via Python interface. Responses are due by March 18, 2024 and should identify equipment and capabilities, customization options, support services, pricing, and manufacturing details. NIST will consider the information to appropriately solicit for its requirements and make no award resulting from this notice.
There is no set-aside designation specified. As this is a sources sought notice, NIST has provided key technical requirements but has not indicated main NAICS/PSC codes, incumbent contractors, or possible award values. Respondents should outline their ability to meet NIST's needs for the scanning electron microscope as part of developing a novel x-ray tomography instrument.
Notice text
NIST is seeking information from sources that may be capable of providing a solution that meets or exceeds the following draft minimum specifications and evaluation criteria. The required item is a scanning electron microscope (SEM), which will be used as part of a novel x-ray tomography instrument. Please see attached noticed for details.
Attachments
| File | Type | Posted |
|---|---|---|
| NIST-SS24-CHIPS-0026_SourcesSought_ecolumn_v06.docx | DOCX document |
Notice history
| Notice | Type | Posted |
|---|---|---|
| Scanning Electron Microscope for X-ray Tomography | Award Notice | |
| Scanning Electron Microscope for X-ray Tomography | Solicitation | |
| Scanning Electron Microscope for X-ray Tomography | Pre-Solicitation |
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