Scanning Electron Microscope for X-ray Tomography

Closed Solicitation Posted

This opportunity was awarded. See the award notice from .

Solicitation number
1333ND24QNB030562
Agency
National Institute of Standards and Technology Department of Commerce
Responses due
Set-aside
No set-aside

Opportunity facts

NAICS code
334516 Analytical Laboratory Instrument Manufacturing
PSC
6640 Laboratory Equipment And Supplies
Place of performance
Boulder, Colorado 80305, United States
Points of contact

Notice details come from SAM.gov. Updated .

About this opportunity

The National Institute of Standards and Technology (NIST), a civilian agency within the Department of Commerce, is seeking to acquire a Scanning Electron Microscope (SEM) to support its CHIPS Metrology Program. The SEM must have specific technical capabilities, including a minimum accelerating voltage of 3 kV and a maximum of at least 30 kV, to enable nanoscale 3D x-ray tomography of nanoelectronics. The SEM must be compatible with a nanopositioning stage and x-ray detectors, and include a solution for cleaning the chamber. The evaluation will be based on technical capability, past performance, and price, with technical and past performance being more important than price. Quotations must be submitted electronically by August 26, 2024.

This is an unrestricted full and open competition, with no set-aside designations. The procurement has a NAICS code of 334516 - Analytical Laboratory Instrument Manufacturing, with a small business size standard of 1,000 employees. The contract will be awarded as a firm-fixed-price purchase order, and the SEM must be delivered and installed at NIST's Boulder, CO facility within 75 weeks of contract award. The government has not provided any information about potential incumbents or current contractors.

Notice text

THIS IS A COMBINED SYNOPSIS/SOLICITATION FOR COMMERCIAL PRODUCTS OR COMMERCIAL SERVICES PREPARED IN ACCORDANCE WITH THE FORMAT IN FAR SUBPART 12.6-STREAMLINED PROCEDURES FOR EVALUATION AND SOLICITATION FOR COMMERCIAL ITEMS-AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. THIS ANNOUNCEMENT CONSTITUTES THE ONLY SOLICITATION; QUOTATIONS ARE BEING REQUESTED, AND A SEPARATE WRITTEN SOLICITATION WILL NOT BE ISSUED. THE SOLICITATION IS BEING ISSUED USING SIMPLIFIED ACQUISITION PROCEDURES UNDER THE AUTHORITY OF FAR PART 13.5 SIMPLIFIED PROCEDURES FOR CERTAIN COMMERCIAL ITEMS.

This solicitation is a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular (FAC) 2024-05 dated May 22, 2024. 

The associated North American Industrial Classification System (NAICS) code for this procurement is 334516- Analytical Laboratory Instrument Manufacturing with a small business size standard of 1,000 employees. This acquisition is being solicited as an unrestricted full and open competition. 

Contarctors must possess an ACTIVE registration in the System for Award Management system, www.SAM.gov, when submitting a quotation and shall continue to be registered until time of award, during performance, and through final payment of any contract resulting from this solicitation. The Contracting Officer will confirm that quoters have an “active” registration at the www.sam.gov website upon receipt of the quotation. If the SAM.gov registration is not active, the quotation will not be considered for award.

***See attached "Request for Quotation" for complete details.***

Attachments

Files attached to this notice, newest first
File Type Posted
Attachment 2- Provisions and Clauses.pdf PDF
Attachment 1- Statement of Requirement (Final).pdf PDF
Request for Quotation.pdf PDF

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
Scanning Electron Microscope for X-ray Tomography Award Award Notice
Scanning Electron Microscope for X-ray Tomography This notice · Latest solicitation Solicitation
Scanning Electron Microscope for X-ray Tomography Original Pre-Solicitation

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