Intent to Award on Sole Source Basis - Low Vacuum Scanning Electron Microscope System
Closed Pre-Solicitation Posted
A newer solicitation was posted. See the latest solicitation from .
- Solicitation number
- 80GRC021P0006
- Agency
- Glenn Research Center National Aeronautics and Space Administration
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
Notice details come from SAM.gov. Updated .
About this opportunity
NASA Glenn Research Center intends to acquire a JSM-IT700HRLA Low Vacuum Scanning Electron Microscope System from JEOL USA, Inc. through a sole source contract. The microscope will include a low vacuum field emission scanning electron microscope with chamber scope, dry SDD-EDS detector, and particle analysis system. Interested parties may submit capabilities and qualifications to Ian Park at NASA by March 16th to be considered for full and open competition of this requirement. Otherwise, NASA will proceed with a sole source award based on responses received.
There is no set-aside designated for this procurement. JEOL USA, Inc. is identified as a potential incumbent. The microscope system is required to support research activities and be installed at NASA Glenn Research Center in Cleveland, Ohio within five months of order receipt.
Notice text
NASA Glenn Research Center (GRC) has a requirement for JEOL JSM-IT700HRLA Low Vacuum Scanning Electron Microscope System
NASA GRC intends to issue a sole source contract to acquire the JSM-IT700HRLA: Low Vacuum Field Emission Scanning Electron Microscope with Chamber Scope, Dry SDD-EDS Detector, and Particle Analysis System from JEOL USA, Inc under the authority of FAR 6.302-1).
The Government intends to acquire a commercial item using FAR Part 12.
Interested organizations may submit their capabilities and qualifications to perform the effort electronically via email to Ian Park at ian.park@nasa.gov not later than Eastern Time on March 16th at 3:00PM. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this acquisition on a competitive basis. A determination by the Government not to compete this acquisition on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the Government.
NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at http://prod.nais.nasa.gov/pub/pub_library/Omb.html
Attachments
| File | Type | Posted |
|---|---|---|
| Statement of Work.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| Field Emission Scanning Electron Microscope System Request for Quotes (RFQ) | Solicitation | |
| Intent to Award on Sole Source Basis - Low Vacuum Scanning Electron Microscope System | Pre-Solicitation |
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