Field Emission Scanning Electron Microscope
Awarded Award Notice Posted
- Solicitation number
- SB1341-16-RQ-0652
- Agency
- National Institute of Standards and Technology Department of Commerce
- Awarded
- to Carl Zeiss Microscopy, LLC
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- DOCSB134117SU0056 Federal contract award
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- Not on record
- Place of performance
- Manufacture of SEM will be at contractor's facility. Delivery and installation will be at the National Institute of Technology Boulder, CO site. Boulder, Colorado 80305, United States
Notice details come from SAM.gov. Updated .
Notice text
Added: Aug 08, 2016 2:14 pm
The NIST Applied Chemicals and Materials Division (ACMD) houses three Groups whose primary work addresses improving the utility and reliability of engineering materials for varied applications ranging from massive load-bearing structures to high-performance semiconductor components. Critical to that work is the ability to measure the surface topography, internal microscopic structure (microstructure), and elemental make-up of materials over length scales ranging from centimeters to nanometers; the measurements must be performed under conditions ranging from high vacuum to humid environments. Within this context, the Nanoscale Reliability Group develops microscopy methods to advance the broad field of material characterization, including methods based on the measurement foundation of a scanning electron microscope (SEM).
NIST has a requirement for one (1) high-resolution, variable pressure field-emission scanning electron microscope (FE-SEM).
All quotes are due to Aron Krischel at aron.krischel@nist.gov no later than August 31, 2016 at 3:00 PM (Mountain Standard Time).
Attachments
| File | Type | Posted |
|---|---|---|
| Amendment_002 _FormSF30.pdf | ||
| Amendment_001 __SF30.pdf | ||
| Attachment_C_-_Past_Performance_Questionnaire_PPQ.docx | DOCX document | |
| Attachment_B_-_Experience_Project_Data_Sheet.docx | DOCX document | |
| Attachment_D_-_RFQ_Question_Inquiry_Submittal_Form.xlsx | XLSX spreadsheet | |
| Attachment_F_-_Schedule.docx | DOCX document | |
| RFQ_SB1341-16-RQ-0652.pdf |
Notice history
| Notice | Type | Posted |
|---|---|---|
| Field Emission-Scanning Electron Microscope | Award Notice | |
| Field Emission Scanning Electron Microscope | Award Notice |
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