CHIPS Atomic Force Microscope (AFM) system

Closed Solicitation Posted

This opportunity was awarded. See the award notice from .

Solicitation number
1333ND23QNB680170
Agency
National Institute of Standards and Technology Department of Commerce
Responses due
Set-aside
No set-aside

Opportunity facts

NAICS code
334516 Analytical Laboratory Instrument Manufacturing
PSC
6640 Laboratory Equipment And Supplies
Place of performance
Gaithersburg, Maryland 20899, United States

Notice details come from SAM.gov. Updated .

About this opportunity

The National Institute of Standards and Technology seeks to acquire a state-of-the-art Atomic Force Microscope system to support nano fabrication and characterization efforts under the CHIPS Act. Proposals are due by April 24, 2023 and will be evaluated based on technical capability, past performance, and price. The award will be a firm-fixed-price purchase order to the offeror representing the best value. The solicitation specifies detailed technical requirements for imaging modes, scan ranges, automation, and software.

There is no set-aside designation for this procurement. The primary NAICS code is 334516 and the solicitation is for a single AFM system to be installed at NIST's Gaithersburg, Maryland campus by 30 days after delivery. Contractors must provide engineering and training support and a one-year warranty including one business day phone support and three business day on-site service. Payments will be made upon acceptance of the fully installed system after successful completion of testing.

Notice text

See the Combined Synopsis Solicitation and NIST Requirements documents for solicitation details. 

Attachments

Files attached to this notice, newest first
File Type Posted
Combined Synopsis Solicitation_final.docx DOCX document
NIST Requirements (final).docx DOCX document

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
Atomic Force Microscope (AFM) system Award Award Notice
CHIPS Atomic Force Microscope (AFM) system This notice · Latest solicitation Solicitation
Atomic Force Microscope/Scanning Probe Microscope (AFM/SPM) Original Pre-Solicitation

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