CHIPS Atomic Force Microscope (AFM) system
Closed Solicitation Posted
This opportunity was awarded. See the award notice from .
- Solicitation number
- 1333ND23QNB680170
- Agency
- National Institute of Standards and Technology Department of Commerce
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- 6640 Laboratory Equipment And Supplies
- Place of performance
- Gaithersburg, Maryland 20899, United States
Notice details come from SAM.gov. Updated .
About this opportunity
The National Institute of Standards and Technology seeks to acquire a state-of-the-art Atomic Force Microscope system to support nano fabrication and characterization efforts under the CHIPS Act. Proposals are due by April 24, 2023 and will be evaluated based on technical capability, past performance, and price. The award will be a firm-fixed-price purchase order to the offeror representing the best value. The solicitation specifies detailed technical requirements for imaging modes, scan ranges, automation, and software.
There is no set-aside designation for this procurement. The primary NAICS code is 334516 and the solicitation is for a single AFM system to be installed at NIST's Gaithersburg, Maryland campus by 30 days after delivery. Contractors must provide engineering and training support and a one-year warranty including one business day phone support and three business day on-site service. Payments will be made upon acceptance of the fully installed system after successful completion of testing.
Notice text
See the Combined Synopsis Solicitation and NIST Requirements documents for solicitation details.
Attachments
| File | Type | Posted |
|---|---|---|
| Combined Synopsis Solicitation_final.docx | DOCX document | |
| NIST Requirements (final).docx | DOCX document |
Notice history
| Notice | Type | Posted |
|---|---|---|
| Atomic Force Microscope (AFM) system | Award Notice | |
| CHIPS Atomic Force Microscope (AFM) system | Solicitation | |
| Atomic Force Microscope/Scanning Probe Microscope (AFM/SPM) | Pre-Solicitation |
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