SEM SOW.pdf
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- Attached to
- Field-Emission Scanning Electron Microscope Federal contract opportunity
- Solicitation number
- 80JSC020Q0005
About this file
This document is a combined synopsis and solicitation for a field-emission scanning electron microscope. The National Aeronautics and Space Administration Johnson Space Center is seeking to acquire a field-emission scanning electron microscope to be delivered to its facilities within five months of award. Key requirements for the microscope include a field-emission gun capable of beam currents up to 500nA at 30kV and 30nA at 1kV, the ability to perform imaging and analysis at voltages as low as 1kV, compatibility with an existing Oxford Symmetry electron backscatter diffraction detector to enable simultaneous acquisition of EDX and EBSD data, and a silicon drift detector EDX system with at least 170mm^2 active area and 127eV energy resolution at 130000cps. Responses are due by 4:30PM Central Time on April 16, 2020, with award being made to the lowest priced technically acceptable offer.
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Text version
Statement of Work XI3/Astromaterials Research Office Scanning Electron Microscope February 3, 2020
JSC (The Astromaterials Research Office within the Astromaterials Research and Exploration Science Division) is designated as the Agency lead center for planetary sample analysis, cosmochemistry, lunar advanced science, and Mars fundamental research. A unique suite of analytical instruments allow for the fulfillment of this Agency responsibility. One component within this suite are electron beam instruments, and currently, the Astromaterials Research Office has a requirement for a field-emission scanning electron microscope (SEM). The SEM is used to visualize geological and astrormaterial samples by collecting high magnification (up to 3 million times) images from samples using two major modes: 1) secondary electron imaging that enables the evaluation of sample morphology, roughness, and grain size; and 2) backscattered electron imaging which provides information on grain size and grain density.
The SEM also has the capability to perform micrometer-scale chemical analyses and element mapping using x-ray spectrometry. This capability is critical to meeting Agency research goals that enable human and robotic missions.
The following represent a minimum list of requirements for the scanning electron microscope:
• Characterization of astromaterials samples:
o The SEM utilizes a field-emission gun that is immersed in the first condenser lens field and should provide – high beam currents up to 500 nA at 30 kV and up to 30 nA at 1 kV.
• Analytical Conditions:
o Performance of both imaging and analytical conditions at very low accelerating voltage
(1kV and below).
o Capable of imaging and analysing any type of solid material, including paramagnetic specimens.
o Capable of operating in a low vacuum mode (150 Pa or better) to enable imaging of non-conductive samples.
• Specialized Imaging Requirements:
o Automated aperture angle control lens (ACL) that optimizes the convergence angle for a wide variety of conditions without altering beam current to maintain smallest (< 1 micron) possible analysis spot size.
o Energy filtering combined with specimen bias applied voltages (from +500 to -2000 V) to enable high resolution imaging of astromaterials and surfaces down to 10V (accelerating voltage) with image resolution better than 2 nm.
o Short (down to 2 mm) working distance backscatter detector for imaging at all accelerating voltages (including low voltage).
o Automatically embed imaging parameters in each recorded image to recall directly from the saved image.
• Chemical Analysis Requirements:
o The SEM shall be equipped with a silicon drift detector for energy-dispersive x-ray (EDX) analysis with an active area of at least 170 mm2 with an energy resolution at the MnKα peak of 127 eV at a count rate of 130000 counts/second. The EDX detector must be compatible with an existing Oxford Symmetry electron backscatter diffraction (EBSD) detector and enable simultaneous acquisition of EDX and EBSD data.
• Other requirements/components:
o 5 axis motor drive stage o Infrared chamber camera to visualize sample exchange o specimen exchange airlock to accept samples up to 100mm in diameter and 40mm in height.
o The SEM shall be equipped with a plasma cleaner to keep the sample chamber clean and free of hydrocarbon contaminants.
• On-site Installation
• User training
• 1 year or more warranty on parts and labor
• Delivery 5 months or less after receipt of order
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