AMENDMENT_0001__Attachment_A_NIST_Requirements_Document.docx
DOCX document 53 KB Posted
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- Multi-Wavelength Monochromator Federal contract opportunity
- Solicitation number
- SB1341-16-RQ-0405
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AMENDMENT 0001 Attachment A NIST Requirements Document to incorporate changes indicated in the Questions answers document.
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| File | Type | Posted |
|---|---|---|
| Amendment_0001_to_Request_for_Quotation.docx | DOCX document | |
| Combined_Synopsis-Solicitation.docx | DOCX document | |
| Attachment_A_-_NIST_Statement_of_Work_(SOW).docx | DOCX document |
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AMENDMENT 0001 Version Attachment A NIST Statement of Work (SOW)
I. BACKGROUND
The Department of Commerce and the National Institute of Standards and Technology (NIST) have developed a major national facility for neutron scattering. This project provides for over 20 unique instrument stations used by national and international researchers for materials research. In addition, instruments are also provided for fundamental physics research, neutron interferometry, and neutron optics.
To remain at the forefront of science, the NIST Center for Neutron Research (NCNR) is continuously developing new and improved instruments for neutron scattering. The proposed acquisition is part of a redesign of the neutron stress diffractometer located at BT-8 of the NCNR, with the goal of revolutionizing the capabilities of this class of neutron instrument, and to address both the needs of the manufacturing community and to build on NIST leadership in non-destructive testing and engineering research.
II. PURPOSE:
The multi-wavelength monochromator is a key component of the redesigned BT8 instrument providing three different wavelengths and more than double the neutron flux on the sample. Its primary purpose is the maximization signal intensity from the sample through both increasing the neutron flux and increasing the number of sample reflections in the detector from one reflection to up to six. It will be a commercial item with modification, making it the first of its kind worldwide and it has the capabilities to speed up measurement of stresses up to threefold. . The specifications of the multi-wavelength monochromator were developed specifically to allow the accurate measurement of applied stresses in iron and aluminum based sheet metal for automotive lightweighting purposes. The design allows for other settings in which only two wavelengths are available such that magnesium based alloys can also be measured.
III. GENERAL REQUIREMENTS
| Criterion |
| Limit |
| 1 |
| Cross section of the primary incident neutron beam on the monochromator |
| 65 mm x 65 mm |
| 2 |
| Crystal blade orientation and arrangement |
| [311],[400],[422] |
| 3 |
| Maximum deviation of the mean scattering direction (MSD) from the surface normal. The MSD is defined as the average scattering direction for all crystals in the monochromator where [311]||[400]|||[422] in the limits of item 5). |
| +/- 1 degree |
| 4 |
| Parallelism of wafer crystals within one orientation: Maximum deviation of lattice plane normals from their mean. |
| +/-0.05 degrees |
| 5 |
| Parallelism of all three orientations: |
The measure for demonstrating parallelism is the compound rocking curve measured on a full thickness ( 33 mm) crystal packet (equal parts of [311],[400], [422] crystals) where the full width at half maximum shall be equal or less than 2 0.15=0.3 degree.
+/- 0.15 degrees
| 6 |
| Maximum deviation from common zone axis [01-1] perpendicular to the scattering plane |
| 2.0 degrees |
| 7 |
| Wafer blade thickness |
| 0.5 mm …0.72 mm |
| 8 |
| Wafer blade height |
| ≤ 11 mm |
| 9 |
| Wafer blade length |
| ≥ 150 mm |
| 10 |
| Crystal area |
| ≥ 150 mm wide |
≥ 90 mm high 33 mm thickness
| 11 |
| Horizontal radius of curvature |
| 2 m …7 m |
| 12 |
| Horizontal curvature control |
| Two-phase DC stepper motor with reduction gear |
| 13 |
| Fixed vertical radius of curvature |
| 0.90 m |
| 14 |
| Maximum bounding box dimensions |
| 215 mm wide x 120 mm deep x 180 mm high. The box dimensions can be adjusted to 215 mm wide x 120 mm deep x 200 mm high if the distance from the center of the crystal packet to the top or bottom of the device is no more than 80mm |
| 15 |
| Surface quality of Si wafers |
| One side lapped and etched |
| 16 |
| Bending device body material |
| Aluminum alloy wherever possible. No material other than silicon or aluminum alloy shall be exposed to the neutron beam. The volume of aluminum exposed to the neutron beam shall be as small as possible. |
| 17 |
| Dead space between wafers |
| Vertical gaps between crystals shall be minimal. The fraction of dead space should be equal or less than 8%. |
| 18 |
| Hard limits |
| Hard stops for the minimum and maximum achievable horizontal curvatures shall be provided such that reference points can be found, and physical damage to the crystals is prevented. |
IV. Dimensions and design envelope
Figure 1: Schematic of the proposed multi-wavelength monochromator. Note that the number of crystals shown does not represent the actual requirements. Key features shown are: Common zone axis [01-1] of all crystals, stacking sequence, and crystal length of 150 mm minimum. Also given are total height and minimum total thickness.
Figure 2: Left: Definition of the mean scattering direction (MSD) as average of the three scattering directions [311], [400], [422]. Right: schematic of the rocking curve measurement with [311], [400], [422] as Bragg angles for the three planes (311), (400) and (422). Assuming a monochromatic measurement, the compound FWHM is the sum of the three individual rocking curves with the respective Bragg angles subtracted, thus allowing a superposition as depicted on the right, bottom.
V. Deliverables
1) Monochromator with radiation resistant 2-phase, bi-polar DC stepper motor
2) Rocking curve/reflectivity curve (theta vs. intensity) for one crystal each: [311],[400],[422]
3) Measured under the same instrumental conditions (beam size, divergence, /) as in item 2): Rocking curve/reflectivity curve (theta vs. intensity) for a complete crystal packet with equal parts of [311], [400] and [422] orientations, 33 mm minimum total thickness, showing that angular width for each orientation, and angular distance between orientations is in agreement with requirements 4,5 and 6
4) Measured under the same conditions as in item 3), and using the same packet of crystals: asymmetric reflection [400] (belonging to the [311] crystals at (-25.24) degree offset from the surface normal (beam extension); and asymmetric reflection [311] belonging to the [400] crystals, also at (-25.24) degree offset from the surface normal.
VI. Delivery/ Installation
1. The Contractor shall provide all deliverables listed in SOW section V. no later than one (1) year after contract award.
2. Installation shall be performed by government personnel.
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