RFI.docx

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Attached to
Field Emission Scanning Electron Microscope Federal contract opportunity
Solicitation number
80GSFCFESEM
Issued by
National Aeronautics and Space Administration Goddard Space Center

About this file

This document includes a Request for Information (RFI) and related federal contract opportunity notice. The National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) Detector Development Laboratory (DDL) requires a field emission scanning electron microscope to be used for high resolution imaging of micro and nanoscale structures. The RFI seeks capability statements from interested parties to inform the development of an acquisition strategy and potential future Request for Proposal (RFP). The related federal contract opportunity provides additional details on the requirement, including that the FESEM must be a production model with at least 10 similar units installed, be new rather than used equipment, and meet SEMI-S2 safety standards. Interested parties should respond to the RFI electronically by April 15th, 2022 with information addressing the requirements. The FESEM will support development of technologies like cosmic microwave background polarization detectors, microwave kinetic inductor detectors, and far-infrared detectors that are important to NASA Goddard's mission.

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RFP for FESEM 4-25-22.pdf PDF
SOW FESEM.docx DOCX document

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Text version

Request For Information (RFI): Date: 03/16/2022

Title: Field Emission Electron Microscope

The National Aeronautics and Space Administration (NASA), Goddard Space Flight Center (GSFC) is seeking capability statements from all interested parties. The GSFC Detector Development Laboratory (DDL) has a requirement to acquire a scanning electron microscope with a field emission source. The system is used for high resolution imaging of micro and nanoscale structures built in the detector development laboratory. The system shall be suitable for secondary electron and backscatter electron imaging at low accelerating voltages.

GSFC is soliciting information through this RFI to survey vendor capabilities in preparation and support of the development of an acquisition strategy and for a potential, future release of a Request For Proposal (RFP) for the high resolution imaging of micro and nanoscale structures built in the detector development laboratory. The purpose of this program is to procure a Field Emission Scanning Electron Microscope (FESEM).

The FESEM consists of electron optics and detectors, a specimen stage, a vacuum system, and computer control. The equipment is essential for nearly all device fabrication projects in GSFC’s Detector System Branch. The equipment is immediately needed for development for the cosmic microwave background polarization technology, microwave kinetic inductor detectors, far-infrared detectors, large format magnetic calorimeters, and microfluidic components thus delivery will be a critical part of this requirement.

No prototypes or one-of-a-kind systems will be considered. The unit shall be a production model with at least 10 similar units working in the field.

A brand-new unit is required, no used equipment or accessories.

The tool shall meet current industry standard requirements SEMI-S2 or equivalent for safety, including shielding, and interlocks for hazardous areas such as high voltages, radiation, and moving parts.

A GSFC site survey visit will be required so that Offeror’s can evaluate the proposed location for the FESEM for vibration, acoustic noise, and stray magnetic fields.

Additional information for this requirement is in the attached Statement of Work (SOW).

Interested offerors shall address the requirements of this RFI in written format by electronic mail to stephanie.jackson-1@nasa.gov.

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