NB6720302200363 - QAs.pdf
PDF 107 KB Posted
- Attached to
- On-Wafer Probes Federal contract opportunity
- Solicitation number
- NB6720302200363
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| File | Type | Posted |
|---|---|---|
| 02 - Specifications (Items).pdf |
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Page Section Para.
1 What is the wafer size?
Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. Wafer sizes that we plan to measure vary from individual 1 cm^2 die to 6 in wafers.
How many Die per Wafer? Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. The number of die per wafer vary based on the application.
How many pads per die? Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. The number of pads per die vary based on the application.
What is the wafer thickness? Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. Wafer thicknesses for our application varies from 100 um to 1 mm.
Is the wafer Silicon or other material? Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. Wafer materials vary from application to application, for high frequency (this procurement) III-V materials are typical.
What type of devices are these? Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. Devices vary by application, wafer, die.
7 Is there a die map and data sheet available (that might covermany of these questions?)
Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. Die maps vary based on application.
Again, this is not a service contract.
8 What is the pad metal stack up?
Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. Metal stack ups vary by application.
9 Do you want the bad die ink marked?
Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. No die will be provided for this action.
10 Do you require any aditioanl processing post test? Irrelevant to the procurement of the on-wafer probes. This procurement action covers the purchase of the wafer probes only, and is not a service contract. No die will be provided for this action.
RFQ Q&A's NB6720302200363 Question
No.
RFP
Attachment
No.
REFERENCE
QUESTION GOVERNMENT RESPONSE
Sheet1 - Table 1 - Table 1
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