N66604-19-Q-2358_RAMAN_-_Minimum_Requirements_.pdf

Salient Features and Minimum Requirements

Confocal Raman Microscopy System

Function Salient Features / Min Requirements Confocal Raman Microscopy for atomic force microscopy technique

System capable of Raman spectra acquisition through Scanning Near Field technique with diffraction limited lateral spectra 250nm between 500-600nm wavelength of excitation.

Compatible atomic force microscopy (AFM) technique capable of lateral range scanning of 100um x 100um and height 20um limits. Capable of handling samples with dimensions of approximately 120 mm x 120 mm and 25 mm height.

Raman Spectrometer & CCD Sensor

Spectroscopy in the Vis range. Thermoelectrically cooled charge-coupled detector device (CCD).

Piezo Force Microscopy

(PFM)

System capable of conducting PFM imaging in current configuration.

Control Software

System must be compatible with simultaneous control of optical microscope camera Raman, SNOM, AFM, etc) features and data correlation between techniques. Parameter setup memory file for each technique. Piezo positioning control and laser assist calibration. Capability to analyze any portion of AFM force-distance curve. Automatic tip approach.

Oscilloscope mode signal monitoring during measurement.

Data export in txt, ASCII, JCamp-DX, MATLAB files.

AFM/Raman/SNOM data overlay analysis. Figure file export.

Raman spectra export with color-coded image representation.

Perpetual license on multiple workstations.

Optical Microscope

Integrated or compatible with optical microscope with 4x turret or higher, white light illumination filter attachment for dark field, DIC or fluorescent contrast. Motorized system for automated approach with up to single 10nm resolution steps.

CMOS camera included.