N66604-19-Q-2358_Brand_Name_Specification_Redacted.pdf

v1.4_MAY 2019

BRAND NAME SPECIFICATION

Raman Microscopy System for Atomic Force Microscopy –Raman (AFM-Raman)

Spectroscopy and Piezoelectric Force Microscopy (PFM) Systems

BACKGROUND:

The Devices, Sensors and Materials Research and Development (R&D) Branch in the Sensors and SONAR Systems Department of the Naval Undersea Warfare Center, Division Newport (NUWCDIVNPT) has a requirement for an atomic force microscopy instrument system with integrated data acquisition and signal analysis capabilities. The system is comprised of several smaller sub-systems including a Raman spectrometer and CCD sensor, as well as a piezoelectric atomic force microscopy unit that is compatible through software.

The atomic force microscope is in need of an upgrade with a Raman spectrometry data acquisition system that can identify chemical composition of the sample at sub-micrometer resolution. A disadvantage of many of the current systems in the market is the lack of flexibility and compatibility with the current WITec system in the laboratory.

The atomic force microscopy instrument required will allow for material analyses in the areas of surface chemistry, surface morphology, electroactive materials, adhesion, imaging material mechanical properties in both R&D and in-service engineering work.

The rationale behind the requirement detailed above is to upgrade current technical capabilities while simultaneously meeting the flexibility for multiple uses in future research. The total value of the proposed upgrade to the current atomic force microscopy systems is estimated to cost

. The delivery date is 10 weeks after purchase order.

REQUIREMENT:

A Modular Raman Spectroscopy with Piezoelectric Force Microscopy (PFM) capability that will upgrade the current AFM system is required. This system consists of a Confocal Raman System and PFM extensions. The components contained within Confocal Raman System and PFM extensions are listed in the below table:

MFGR Part No Description/Title Qty Configs (If applicable)

XUM3000-0050

Confocal Raman Microscopy extension for WITec alpha300 A setups to

RA, 1

XMX3022-1000 Laser coupler for WITec microscopes 1 XSL3100-1154 DPSS laser, 532 nm, 75 mW 1 XZF3100-0532 WITec RayLine Raman filter set for 5 1 XCL1000-0532 Software controlled continuous lase 1 XMZ4000-1005 Additional automation capabilities f 1 XDS3000-0001 WITec advanced primary spectrosco 1 XMX3021-0001 Output coupler for WITec microscop 1 XMC3200-0350 Ultra-High-Throughput-Spectromete 1 XMC3022-1001 Highly efficient thermoelectrically c 1 XSA3200-0003 WITec integrated Calibration lamp incl. coupling unit XSO3026-1000 Objective 100x, Zeiss EC "Epiplan-Neofluar" DIC, XCK3001-0020 Installation and training

Piezo Force Microscopy Extension 1

BRAND NAME SPECIFICATION:

The Confocal Raman and Piezoelectric Force Microscopy systems from WITec are both extensions (modules) compatible with NUWC ’s existing Atomic Force Microscopy (AFM) configuration, also from WITec. The ability to use NUWC’s existing equipment, AFM, with the Raman and PFM systems from WITec will increase the versatility of conducting simultaneous AFM-Raman and PFM for materials characterization in the different current research areas at NUWC. Both Raman and PFM are system extensions to the current measurement capability from WITec. No other company will have Raman and PFM systems that can be extensions to current NUWC capabilities.

The proposed Raman and Piezo Force Microscopy instrument quoted by WITec Instruments Corp.

is the only modern multi-platform system in the market that fulfills the requirements for resolution and speed but is also compatible with the current AFM capabilities. This system maintains flexibility which allows NUWC’s material characterization laboratory to upgrade and adapt the instrument for emerging research needs.

The Market Research performed additionally identifies cost and schedule impacts of potentially procuring another configuration of the required system. The laboratory currently requires a system that is interoperable with the WITec microscope. A WITec microscope, which comes with the basic (Atomic Force Microscopy (AFM) and Electron Force Microscopy (EFM)) costs approximately If the Requiring Department were not able to procure the Raman Microscopy System with Piezoelectric Force Microscopy (PFM) which is compatible with the current WITec microscope; it would cause an approximately 6 months’ delay in the collection of data that the laboratory needs to gather simultaneously for the different aspects of R&D that the lab needs to perform.

Product Comparison Matrix

Minimum Specifications

Witec Instruments Corp (Quote

103123)

Nanonics Ltd (Quote NI-

44716)

Bruker Nano Inc., (Quote -)

(1)

Integrated unit with software capable of simultaneous instrument control and fast data acquisition (DAQ) with perpetual license

Y Y Y

(2)

AFM cantilever force-distance curve capable of handling a minimum 4-5 M samples/second

Y Y N

(3)

System capable of mapping and correlate Raman spectra acquisition through Scanning

Near Field technique & simultaneous AFM capabilities

Y Y N

(4) Raman Spectrometer & CCD Sensor Y Y Y

(5) Piezo Force Microscopy (PFM) Y Y Y

(6) Data export formats:

txt, ASCII, JCamp-DX Y Y Y

(7) Windows 10 OS and compatible software Y Y Y

(8)

Positioning Scanner accuracy less than 1 nm and with lateral 100um x 100um and height 20um scanning limits

Y N N

(9) Cantilever probe excitation between 10Hz to 500 kHz

Y N N

(10)

Optical microscope must be compatible with the current Witec microscope for loading, probe approach to samples and quality control

Y N N

Meets Requirements? Y N Decline

Cost Decline

Small/Large Business

(www.sam.gov) - CAGE Code: -

GSA/Open Market (If GSA include GSA Contract Number)

Company Address/POC/email/

Phone # 130G Market Place Blvd.

Knoxville TN 37922/Tavis Ezell/ tavis.ezell@witec-instruments.com/865 -789-4605

19 Hartum St.

BYNET Bldg, Har Hotzvim Hi Tech Park, Jerusalem

97775 Israel /Aaron

Lewis/aaron @nanonics.com/ 972.2.678-9573 Fax: 972.2.648-

112 Robin Hill Rd, Goleta, CA

93117/Rober Fucci/Robert.Fucc i@bruker.com/86

0-399-7855

RESELLERS:

There are no resellers for Raman and Piezoelectric Force Microscopy systems.

Requiring Department:

Based on the above, I recommend this acquisition be conducted on a Brand Name Specification basis. I certify the technical data which form the basis of this justification are complete and accurate.

http://www.sam.gov/

Print Name Here and sign above Date Insert Title, Code

APPROVAL:

Contracting Officer:

Based on the above, I have determined that the circumstances of the contract action deem only one source reasonably available/only this brand can fulfill the requirements. I certify that this justification is accurate and complete to the best of my knowledge and belief.