Attachment_2_-_Specifications.docx

MINIMUM REQUIREMENTS FOR A

Micro Thermal Imaging Microscope System with Temperature Analysis Capabilities 13 Oct 15

GENERAL

This specification lists the requirements to purchase a Micro Thermal Imaging Microscope System with Temperature Analysis Capabilities for used in hot spot detection and thermal analysis in MEMS.

1. Purchase one Micro Thermal Imaging Microscope System for Microscopic Temperature Analysis capable of thermal imaging at the micron scale. The system must have the following capabilities/features:

0. Thermal Camera (LWIR)

0. 20 μm /pixel lens

0. Wide Angle Lens 50x37.5

0. Vertical Focusing Stage

0. XY sample positioning stage (120x120 mm movement)

0. Thermalyze electronics analysis software or equivalent with hot spot detection

0. Computer and components

1. The system must have a field of view greater or equal to 6.4 x 4.8 mm while retaining a resolution of 20 μm/pixel

1. The system must be able to perform true temperature mapping.

1. The system must be able to perform hot spot detection

REQUIREMENTS

The system must be integrated into a fully functional system that can do temperature mapping at the micro scale 20 μm /pixel with a field of view greater or equal to 6.4 x 4.8 mm, and 100 μm /pixel with a field of view greater or equal to 31.5 x 24 mm

PERIOD OF PERFORMANCE

The customer will receive all components 4 weeks after contract award.

DELIVERY AND TRAINING

The contractor will deliver hardware to the Air Force Institute of Technology (AFIT) at WPAFB, OH. An operational and maintenance manual will be provided.

WARRANTY

Free from defects in material and workmanship, under normal and proper use in accordance with our instructions in the maintenance manual, for the period of time of one year after receipt.