Govt._Responses_Benchtop_SEM_20180711.docx.pdf

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Attached to
Benchtop Scanning Electron Microscope (SEM) Federal contract opportunity
Solicitation number
F3ST708031A007
Issued by
Department of the Air Force Space Command

About this file

Attached is the Government responses to the contractor questions received. As a reminder, the deadline to submit a quote for this requirement is 17 Jul 2018 by 2:00PM PST.

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Salient_Characteristics_for_SEM_Amended_20180702.docx.pdf PDF
RFQ_Benchtop_SEM_Template_20180627.xlsx XLSX spreadsheet
Salient_Characteristics_for_Benchtop_SEM_20180406.pdf PDF

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QUESTIONS AND ANSWERS:

Benchtop Scanning Electron Microscope (SEM)

RFQ# F3ST708031A007

Questions were due to 30 CONS by 09 Jul 2018 at 2:00 PM PST. The following questions were received and answers are provided below. As a reminder, proposals are due by 17 Jul 2018, 2:00 PM PST.

Question 1: No CeB6 source lasts 3 years. They are specified to last 1500 beam hours so life depends on frequency of use. There is usually no application specific reason to require CeB6 except possibly biological imaging. Can you explain why a CeB6 is required?

Response 1: The CeB6 is required to last 3 years for the frequency of use at this lab. Any vendor will be required to replace the source onsite if it fails in the first 3 years because of the limited time that will be dedicated to maintaining this instrument. Due to the minimal time available to be devoted to maintaining an SEM, the lab requires a source that does not require regular changing, maintenance or regular column cleaning due to source evaporation. The CeB6 source provides more current in a smaller spot at the sample giving improved resolution and a greater number of electrons. The lab requires the high brightness source to maximize resolution at lower accelerating voltages and to minimize time for elemental mapping.

Question 2: Why is a 2048 x 2048 image format required as opposed to other pixel sizes?

Response 2: The lab needs to maintain its ability to print large photographic quality SEM images to supply with reports. Any larger image format is acceptable and larger than 2400 x 3000 is ideal.

Question 3: The accelerating voltage on the Salient Characteristics specifies that the SEM must go up to

18kV. Will higher and lower ranges be accepted?

Response 3: Higher is acceptable; lower is not acceptable. The instrument must be able to reach at least 18kV for necessary elemental analysis.

Question 4: The Salient Characteristics require that the Benchtop SEM be capable of accommodating samples up to 100 mm x 100 mm in size. This is a very specific size; why is it important to have such a specific size?

Response 4: Any size larger than 100 mm x 100 mm is acceptable as well. We need to maintain as much of a full size SEM capability as possible with a desktop model and need the ability to analyze instrument/spacecraft fragments. Ideally, there would be a benchtop model capable of housing a sample around 350 mm x 250 mm, but 100 mm x 100 mm is the minimum size requirement.

Question 5: Why does the total pump down time from air to SEM image need to be <45s?

Response 5: The total pump down time required is <45s because there will not be a dedicated technician to the instrument and the lab has limited time for this additional analysis technique. The instrument should be mostly self-sufficient and capable of analyzing a sample quickly. One of the largest limiting factors preventing the lab from purchasing an SEM in the past is the runtime. The quick pump down contributes to the lab’s ability to operate the instrument at all due to manpower constraints.

Question 6: The Salient Characteristics require a separate computer with software integration. Will other forms of integrated hardware and software be accepted such as one that is already built into the SEM?

Response 6: Yes

Question 7: The Salient Characteristics require separate elemental mapping software. Will built-in forms of “or equal” software be accepted for Mapping?

Response 7: Yes

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