512Specs_TEM_Micro_mv.docx

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Transmission Electron Microscope Federal contract opportunity
Solicitation number
12305B-ERRCTEM-001
Issued by
Department of Agriculture Agricultural Research Service Field Research Implementation and Information Delivery Northeast Area

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Transmission Electron microscope

Specifications:

· Windows 10 computer

· Resolution: 0.20 nm@ 100kV

· Voltage range:

· 20kV to 120kV

· Low voltage range combined with the HC capability of the dual-mode lens.

· Simple Start-up and Shut-down:

· Activation of the accelerating voltage, filament voltage, and bias is computer controlled for quick and easy start-up.

· Users of various experience levels can effectively operate the microscope from start-up to shut-down with single button automated procedures.

· Dual Lens Modes:

· Automatic switching between High Contrast and High Resolution (Dual lens mode)

· Standard configuration provides High Contrast (HC) and High Resolution (HR) imaging modes utilizing a compound objective lens system to alter focal length and Cs values.

· Switching between modes is done via software control

· Digital Operation:

· Microscope setup, electrical alignments and sample search procedures are conducted under normal room light conditions utilizing high speed digital navigation camera with a standard computer display.

· An integrated high-resolution camera final image collections are obtained in the same.

· Operations (from setup to final image capture) can be displayed on a large wall monitor, at a remote location, or recorded to video using common PC accessories.

· Turbo-Molecular Pumped (TMP) Vacuum System:

· Utilization of a TMP in conjunction with reduction in spatial volume under vacuum

· Design also minimizes the potential for specimen damage and contamination allowing users to address a wide variety of specimen types/preparations.

· High precision stage

· The 5-axis ultra-stable goniometer with a 'ball-in-cup' holder design for two steady points of contact during specimen manipulation.

· Stage and holder design translates to increased image stability under a wide range of operating conditions.

· This is especially important during tilting / tomography and in high-throughput scenarios where high magnification imaging is necessary immediately after insertion of the holder into the electron column.

· Advanced Stage Navigation:

· The stage can trace movements, record positions / tilt angles, and utilize a low magnification navigation image to minimize repeated viewing of the same area or repeatedly exposing sensitive specimens to the electron beam.

· The operator can quickly verify that all areas of the specimen grid have been examined and easily recall saved positions for further analysis.

· Anticontamination device:

· A 'cold finger' or some similar anti-contamination device is useful to stabilize the sample and keep the microscope column clean.

· Automated Pre-Irradiation (API) acclimates the specimen to the electron beam, reducing thermal expansion and helping to eliminate sample drift.

· Reduced Specimen Damage:

· Incorporates an air leak mechanism for the specimen pre-pumping chamber to prevent damage to sensitive samples during specimen exchange.

· No Image Rotation:

· The image is stable (no rotation) throughout the entire magnification range.

· Camera pixel size:

· A smaller pixel size is desired for greater resolution of images.

· Training:

· Onsite training in the operation of the microscope and image acquisition software is essential.

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