512Specs_TEM_Micro_mv.docx
DOCX document 17 KB Posted
- Attached to
- Transmission Electron Microscope Federal contract opportunity
- Solicitation number
- 12305B-ERRCTEM-001
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Specifications
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| File | Type | Posted |
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| Specs_TEM_Micro_-1.docx | DOCX document | |
| asCI__(FAC_2019_THRU_032519).docx | DOCX document |
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Text version
Transmission Electron microscope
Specifications:
· Windows 10 computer
· Resolution: 0.20 nm@ 100kV
· Voltage range:
· 20kV to 120kV
· Low voltage range combined with the HC capability of the dual-mode lens.
· Simple Start-up and Shut-down:
· Activation of the accelerating voltage, filament voltage, and bias is computer controlled for quick and easy start-up.
· Users of various experience levels can effectively operate the microscope from start-up to shut-down with single button automated procedures.
· Dual Lens Modes:
· Automatic switching between High Contrast and High Resolution (Dual lens mode)
· Standard configuration provides High Contrast (HC) and High Resolution (HR) imaging modes utilizing a compound objective lens system to alter focal length and Cs values.
· Switching between modes is done via software control
· Digital Operation:
· Microscope setup, electrical alignments and sample search procedures are conducted under normal room light conditions utilizing high speed digital navigation camera with a standard computer display.
· An integrated high-resolution camera final image collections are obtained in the same.
· Operations (from setup to final image capture) can be displayed on a large wall monitor, at a remote location, or recorded to video using common PC accessories.
· Turbo-Molecular Pumped (TMP) Vacuum System:
· Utilization of a TMP in conjunction with reduction in spatial volume under vacuum
· Design also minimizes the potential for specimen damage and contamination allowing users to address a wide variety of specimen types/preparations.
· High precision stage
· The 5-axis ultra-stable goniometer with a 'ball-in-cup' holder design for two steady points of contact during specimen manipulation.
· Stage and holder design translates to increased image stability under a wide range of operating conditions.
· This is especially important during tilting / tomography and in high-throughput scenarios where high magnification imaging is necessary immediately after insertion of the holder into the electron column.
· Advanced Stage Navigation:
· The stage can trace movements, record positions / tilt angles, and utilize a low magnification navigation image to minimize repeated viewing of the same area or repeatedly exposing sensitive specimens to the electron beam.
· The operator can quickly verify that all areas of the specimen grid have been examined and easily recall saved positions for further analysis.
· Anticontamination device:
· A 'cold finger' or some similar anti-contamination device is useful to stabilize the sample and keep the microscope column clean.
· Automated Pre-Irradiation (API) acclimates the specimen to the electron beam, reducing thermal expansion and helping to eliminate sample drift.
· Reduced Specimen Damage:
· Incorporates an air leak mechanism for the specimen pre-pumping chamber to prevent damage to sensitive samples during specimen exchange.
· No Image Rotation:
· The image is stable (no rotation) throughout the entire magnification range.
· Camera pixel size:
· A smaller pixel size is desired for greater resolution of images.
· Training:
· Onsite training in the operation of the microscope and image acquisition software is essential.
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