Federal Grant Award Summary

The National Science Foundation (NSF) Division of Chemistry awarded a $550,000 Project Grant to the University of North Carolina at Chapel Hill, effective July 1, 2026 through June 30, 2029, under the Mathematical and Physical Sciences program (CFDA 47.049). Professor James Cahoon and his research team will develop operando pump-probe microscopy as a novel experimental technique for directly observing ultrafast charge-carrier dynamics in electrically biased semiconductor nanostructures. The project addresses a significant gap in semiconductor science by enabling real-time visualization of electron and hole behavior under applied electrical bias conditions—a capability absent from most previous studies conducted under open-circuit conditions. The research will yield fundamental understanding of how applied voltage, internal electric fields, and steady-state current flow influence charge-carrier motion, creating a quantitative connection between microscopic charge dynamics and macroscopic device performance.

The project deliverables include establishment of an experimental framework employing femtosecond temporal resolution and diffraction-limited spatial resolution microscopy, fabrication of microscopy-compatible resistor, diode, and field-effect transistor device architectures, and systematic characterization of bias-dependent carrier behavior across varied electrical configurations. The effort will generate peer-reviewed publications and presentations at scientific meetings, while providing interdisciplinary training to graduate and undergraduate students in spectroscopy, semiconductor fabrication, materials science, and device modeling. These outcomes directly support national priorities for maintaining U.S. competitiveness in semiconductors and microelectronics.