The National Aeronautics and Space Administration Johnson Space Center awarded a $693,000 purchase order to Jeol USA Inc. to deliver a field-emission scanning electron microscope. The solicitation sought a microscope capable of beam currents up to 500nA at 30kV and 30nA at 1kV, compatible with an existing Oxford Symmetry electron backscatter diffraction detector. There was no set-aside designation for this award under NAICS code 334516 for microscopy instrument manufacturing. Jeol USA will deliver the microscope to NASA's Johnson Space Center in Houston, Texas within five months, meeting the agency's requirements for research equipment supporting its human spaceflight programs.