Scanning Electron Microscope W/Focused Ion Beam
Closed Solicitation Posted
This opportunity was awarded. See the award notice from .
- Solicitation number
- 75N92018Q0251
- Agency
- National Institutes of Health Department of Health and Human Services
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- 75N92018P00060 Federal contract award
- NAICS code
- 333314 Optical Instrument and Lens Manufacturing
- PSC
- Not on record
- More information
Notice details come from SAM.gov. Updated .
Notice text
Scanning Electron Microscope (SEM) equipped with a Focused Ion Beam (FIB)and a Schottky Field Electron Source. See attached Combined Synopsis/Solicitation for details..
Notice history
| Notice | Type | Posted |
|---|---|---|
| Scanning Electron Microscope (SEM) equipped with a | Award Notice | |
| Scanning Electron Microscope W/Focused Ion Beam | Solicitation |
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