Scanning Electron Microscope W/Focused Ion Beam

Closed Solicitation Posted

This opportunity was awarded. See the award notice from .

Solicitation number
75N92018Q0251
Agency
National Institutes of Health Department of Health and Human Services
Responses due
Set-aside
No set-aside

Opportunity facts

Contract number
75N92018P00060 Federal contract award
NAICS code
333314 Optical Instrument and Lens Manufacturing
PSC
Not on record
More information

Notice details come from SAM.gov. Updated .

Notice text

Scanning Electron Microscope (SEM) equipped with a Focused Ion Beam (FIB)and a Schottky Field Electron Source. See attached Combined Synopsis/Solicitation for details..

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
Scanning Electron Microscope (SEM) equipped with a Award Award Notice
Scanning Electron Microscope W/Focused Ion Beam This notice · Latest solicitation Solicitation

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