Notice of Intent

Added: Aug 07, 2015 7:39 am NOTICE OF INTENT

The Materials Measurement Science Divisions performs research and development of microbeam analysis techniques for the chemical, morphological, and crystallographic characterization of matter down to nanometer spatial scales using excitation beams of electrons and x-rays to generate a variety of secondary signals that yield elemental and molecular information; studies fundamental measurements including x-ray and electron spectroscopies, computer aided imaging, and diffractometry to understand the basic chemistry and physics of microbeam sample interactions; develops improved methods of quantification as well as Standard Reference Materials and Data; and applies enhanced and multidisciplinary microanalysis and surface analysis techniques to diverse problems in material, semiconductor, optoelectronic, environmental, biological, and process technologies.

In support of the NIST mission, the Materials Measurement Science Division owns a state of the art, aberration-corrected scanning transmission electron microscope (STEM). The instrument is equipped with an electron energy loss spectrometer (EELS) and a bright-field/dark-field detector, both of which are manufactured by Gatan Inc. Currently, the image and spectral signals are collected using software designed by the microscope manufacturer, FEI Co. This software is not fully compatible with the EELS and bright-field/dark-field detector, resulting in reduced functionality that is limited in terms of the speed of acquisition, output data quality, and the ability to design custom data acquisition experiments through an open scripting interface.

NIST requires a hardware and software upgrade of the Gatan EELS and bright-field/dark-field detector system which is fully compatible with the existing hardware and affords greatly improved performance. Gatan Inc. offers an optimally compatible upgrade which is fully scriptable and capable of acquiring superior data at higher speeds due to full integration between software and hardware. It consists of a software suite as well as hardware peripherals for controlling the beam position and data readout. The EELS system and imaging detectors, both manufactured by Gatan Inc., are proprietary technology and other data acquisition systems does not exist which are capable of the required level of interaction with the equipment.

NIST cites 41 U.S.C. 3304(a)(1) (see excerpt below) as the primary rationale for the Sole Source Determination. Only one responsible source and no other supplies or services will satisfy agency requirements.

Gatan Inc. is the sole manufacturer and distributor of the hardware and software upgrade components. Gatan, Inc. technicians are the only certified technicians for installation and training services for Gatan equipment.

The NAICS Code is 334516, and the standard size is 500 employees.

No solicitation package will be issued. This notice of intent is not a request for competitive quotations; however, interested persons may identify their interest and capability to respond to this requirement. The Government will consider responses received by August 24, 2015. Inquiries will only be accepted via e-mail to kandy.clark@nist.gov. No telephone requests will be honored.

A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement in the future.