Integrity and Reliability of Integrated Circuits (IRIS)

Added: Jul 21, 2011 11:52 am DARPA-BAA-10-33 deals with innovative research proposals in the area of integrated circuit (IC) analysis to determine functionality and reliability of complex integrated circuits for military applications. The objective of the Integrity and Reliability of Integrated Circuits (IRIS) program is to develop the technology to derive the functionality of an IC to determine unambiguously if malicious modifications have been made to that IC, and to accurately determine the IC's useful lifespan from a physical perspective. Changes such as additions in functionality or intentionally reduced lifespan could cause faulty operation of systems that rely on the proper operation of ICs, since ICs are at the core of most systems and provide the critical functionalities that differentiate systems (e.g., detection and signal processing, targeting, and processing). Complex ICs can have billions of transistors and contain complex subcircuits from third parties and may be designed and produced by sources with unknown provenance.