GEMSC QUANTAX Micro-XRF

This is a Sources Sought Notice only. This is not a request for proposal, but a survey to locate potential sources. This Sources Sought does not constitute an Invitation for Bids, Request for Proposals or a Request for Quotations, and is not to be construed as a commitment by the Government to issue an order or otherwise pay for the information solicited, nor is it a guarantee of a forthcoming solicitation or contract. It is for market research purposes only. Respondents will not be notified of the results of the evaluation.

The purpose of this Sources Sought Notice is to gain knowledge of interest, capabilities, and qualifications of various members of industry, to include the Small Business Community: Small Business, Section 8(a), Historically Underutilized Business Zones (HUB-Zone), Service-Disabled Veteran-Owned Small Business (SDVOSB), Women-Owned Small Business (WOSB), and Economically Disadvantaged Women-Owned Small Business (EDWOSB). The Government must ensure there is adequate competition among the potential pool of responsible contractors. Small business, Section 8(a), HUBZone, SDVOSB, WOSB, & EDWOSB businesses are highly encouraged to participate.

NAICS Code: 334516 ANALYTICAL LABORATORY INSTRUMENT MANUFACTURING

NAICS Size Standard: 1,000 employees

Subject: Sources Sought for GEMSC QUANTAX Micro-XRF

Sources Sought Closing Response Date: October 18, 2023

Contact Point: Kimberly Schneider, krschneider@usgs.gov

Objective: To find sources that are qualified to meet the supplies/services as listed below. Note that the specific requirements are subject to change prior to the release of any solicitation.
The USGS Geology, Energy & Minerals Science Center (GEMSC) has a requirement for a QUANTAX Advanced Integrated Micro-XRF (µ-XRF) Source with XTrace 2 µ-XRF to add to existing equipment, Hitachi SU5000 Automated Mineralogy Analyzer (AMA) microscope. The Micro-XRF must fully integrate into the current AMA configuration.

Specifications/Salient Characteristics:
The µ-XRF Source consists of an x-ray source and software for data processing and analysis. These components need to be coupled with an Energy Dispersive Spectroscopy (EDS) detector already part of the existing AMA microscope under procurement.

The following salient characteristics are required:

µ-XRF x-ray source for utilization on scanning electron microscopes with the following:
-wide elemental identification range
-sensitivity to measure elements down to 10s of parts per million range
-air-cooled micro spot x-ray tube
-target material of Rh
-tube parameters of 50 kV
-software controlled filter revolver with multiple filters
-ability to define spot sizes
-safety x-ray tube shutter

Software for data analysis and processing that includes spot analysis, elemental distribution analysis, and distribution data evaluation. In addition to the live software license used to collect data on the microscope, at least 4 additional offline data analysis licenses are needed.

Rapid stage movement for high-speed elemental mapping able to travel at least 50 x 50 mm for direct scanning.
The only known company that manufactures a µ-XRF Source and software that can be fully integrated into our current AMA microscope is Bruker Corporation.

Responses: All interested parties should notify this office via e-mail within the posted date. Responses shall include:
(I) To what extent each of the specifications can be met.
(II) Include your type of business (i.e. commercial, academia), whether your organization is classified as a large or small business. If a small business, you must also list any small disadvantaged status you hold [HUBZone, 8(a), Service Disabled Veteran Owned Small Business (SDVOSB), Women Owned Small Business (WOSB), Economically Disadvantaged Women-Owned Small Business (EDWOSB), etc.].
(III) Experience/ performance through the description of completed projects.