Focused ION beam maintenance sole source procurement

Added: Mar 02, 2017 7:35 am Statement of Work AAS #163400018
Maintenance of
FEI Helios FIB/SEM Dual Beam
1. Background:
1.1 Benet Labs' FEI Helios 600A Focused Ion Beam / Scanning Electron Microscope is a scientific instrument that combines the imaging capabilities of a scanning electron microscope (SEM) with the micro-machining capabilities of a focused ion beam system (FIB). The dual-beam allows the Lab to characterize cutting edge materials, including nano-structured and non-metallic designs, composite structures, atomic-scale materials, and non-metallic coatings in-house. In order to maintain the quality, reliability, and accuracy of the instrument, periodic maintenance is required.
2. Applicable Documents: None.
3. Scope/Objective:
3.1 Provide maintenance, support, repair and software updates to FEI Helios 600A FIB/SEM Dual Beam.
4. Requirements:
4.1 Contractor shall provide maintenance service to include 1PM per year, calibration to factory specification, OEM replacement parts, as available, labor, materials, repairs, support, and software updates where necessary on the following items:
4.1.1 Helios Nanolab 600A, S/N 9921883
4.1.2 FEI Easylift, S/N 9921883.1
4.1.3 Pt Deposition, S/N 9921883.2
4.1.4 ICE Detector, S/N 9921883.3
4.1.5 STEM Detector
4.1.6 NavCam
4.1.7 xT Control Software
4.2 Contractor shall not be required to provide consumable items such as, but not limited to:
4.2.1 Final Apertures
4.2.2 Scintillators
4.2.3 Filaments
4.2.4 Ion Sources
4.3 Contractor's targeted response time for service call(s) shall be 48 hours after being notified of equipment problem or failure. FEI shall provide telephone support for repair and maintenance of the Equipment during FEI business hours (Monday through Friday, 8:00 am - 5:00 pm, based on the time zone in which the Equipment is located, exclusive of FEI holidays).
5. QASP:
Performance Objectives
Reference
Acceptable Quality Level (AQL)
Method of Surveillance
Provide 1 PM per year