Field emission scanning electron microscope with accesories
Awarded Award Notice Posted
- Solicitation number
- N0016418Q0106
- Agency
- Naval Sea Systems Command Department of the Navy, Department of Defense
- Awarded
- to Hitachi High-Tech America, Inc.
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- N0016418CGM63 Federal contract award
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- Not on record
Notice details come from SAM.gov. Updated .
Notice text
3 versions
Update #3 · Latest ·
Added: Jul 26, 2019 10:07 am. Awarded Vendors: Hitachi High Technologies America, Inc.. Contract Award Dollar Amount: 378,980.00. Contract Award Date: 2018-09-14.
Update #2 ·
N0016418Q0106 - FIELD EMISSION SCANNING ELECTRON MICROSCOPE WITH ACCESORIES - PSC 6640 - NAICS 334516
Solicitation Issue Date: 16 APRIL 2018 - Solicitation Closing Date: 21 MAY 2018 - Time 2:00 PM EST
Naval Surface Warfare Center (NSWC) Crane has a requirement for the acquisition of a Field Emission Scanning Microscope (FE-SEM). The FE-SEM will be used to do advanced failure analysis techniques such as: electron beam induced current (EBIC), passive voltage contrast, active voltage contrast (both static and dynamic), and charge-induced voltage alteration (CIVA).
The Navy intends to solicit and negotiate this contract on a full and open competition IAW FAR 6.1. Delivery is required FOB Destination.
This solicitation is being issued pursuant to the procedures at FAR 13.5. All changes that occur prior to the closing date will be posted to the FedBizOpps website. For changes made after the closing date, only those offerors that provide a proposal will be provided any changes/amendments and considered for future discussions and / or award.
Questions or inquiries should be directed to Mr. Dayne Holder, telephone 812-854-4995, e-mail dayne.holder@navy.mil. Please reference the above solicitation number when responding to this notice.
.
Update #1 ·
Added: Apr 16, 2018 3:54 pm
N0016418Q0106 - FIELD EMISSION SCANNING ELECTRON MICROSCOPE WITH ACCESORIES - PSC 6640 - NAICS 334516
Solicitation Issue Date: 16 APRIL 2018 - Solicitation Closing Date: 21 MAY 2018 - Time 2:00 PM EST
Naval Surface Warfare Center (NSWC) Crane has a requirement for the acquisition of a Field Emission Scanning Microscope (FE-SEM). The FE-SEM will be used to do advanced failure analysis techniques such as: electron beam induced current (EBIC), passive voltage contrast, active voltage contrast (both static and dynamic), and charge-induced voltage alteration (CIVA).
The Navy intends to solicit and negotiate this contract on a full and open competition IAW FAR 6.1. Delivery is required FOB Destination.
This solicitation is being issued pursuant to the procedures at FAR 13.5. All changes that occur prior to the closing date will be posted to the FedBizOpps website. For changes made after the closing date, only those offerors that provide a proposal will be provided any changes/amendments and considered for future discussions and / or award.
Questions or inquiries should be directed to Mr. Dayne Holder, telephone 812-854-4995, e-mail dayne.holder@navy.mil. Please reference the above solicitation number when responding to this notice.
Attachments
| File | Type | Posted |
|---|---|---|
| 18Q0106_Sol.pdf |
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