Accessories for Field Emission Scanning Electron Microscope

Awarded Award Notice Posted

Solicitation number
SB1341-16-RQ-0999
Agency
National Institute of Standards and Technology Department of Commerce
Awarded
to Edax, LLC
Set-aside
No set-aside

Opportunity facts

Contract number
DOCSB134117SU0061 Federal contract award
NAICS code
334516 Analytical Laboratory Instrument Manufacturing
PSC
Not on record
Place of performance
Contractor's facility, United States

Notice details come from SAM.gov. Updated .

Notice text

2 versions

Update #2 · Latest ·

Added: Sep 07, 2016 1:45 pm Amendment 001 is issued to provide a government response to a question received.

Question: Reference Attachment B, page 18, Section 1. Background. The description refers to an older SEM, a LEO 1525 which is to be upgraded.  Does this micrscope have a standard chamber or the optional WEX chamber as this affect the ability to add EBSD.

Government Response: The LEO 1525 microscope does NOT have a WDS chamber.

All other terms and contions to this solicitation remain unchanged. 

Update #1 ·

Added: Aug 26, 2016 11:43 am The National Institute of Standards and Technology in Boulder, CO has a requirement for Accessories for a Field Emmision Scanning Electron Microscope.

This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotes are being requested and a written solicitation will not be issued.

The National Institute of Standards and Technology (NIST) has a requirement for the purchase of Accessories for a Field Emission Scanning Electron Microscope (FE-SEM)per the attached specifications.


This RFQ is conducted under the authority of FAR 13 Simplified Acquisitions with NAICS code 334516, having a Small Business Size Standard of 1000 employees. This is a total small business set aside.


All communications and documents must include the solicitation # NB647050-16-04483. Please email your quote to me at aron.krischel@nist.gov no later than September 9, 2016, 10:00 AM Mountain Standard Time. Please direct any questions regarding this solicitation to Aron Krischel, Contract Specialist, at aron.krischel@nist.gov no later than September 1, 2016 at 10:00 AM Mountain Standard Time. Your quote must meet all of the requirements of FAR 52.212-1, as well as include the following information:


• Information sufficient to demonstrate you can meet or exceed the requirements in the Specifications.
• Firm fixed price quote for the Accessories for a FE-SEM.
• Payment Terms: Net 30.
• The requested delivery is within 30 days after receipt of the order (ARO). FOB Destination for delivery to NIST, 325 Broadway, Boulder, CO 80305. Delivery point of contact will be provided upon award.
• Company DUNS No. In order to be eligible for this award, the quoter must be registered with the System for Award Management at www.sam.gov., and have completed the Representations and Certifications therein for the specified NAICS code, or submit separate Representations and Certifications if the specified NAICS code is not listed in their SAM registration.


The provision at FAR 52.212-1, Instructions to Offerors-Commercial, applies to this acquisition. Quoter shall clearly demonstrate their ability to meet the technical requirements and deliverable schedule as outlined in this solicitation. Quote shall include shipping costs. NIST reserves the right to ship under NIST provided account.

Please see attached for the specifications and basis of award. 


 

Attachments

Files attached to this notice, newest first
File Type Posted
Form_SF30 _Amendment_001.pdf PDF
Attachment_D_-_RFQ_Question_Inquiry_Submittal_Form.xlsx XLSX spreadsheet
SB1341-16-RQ-0999.pdf PDF
Attachment_C_-_Past_Performance_Questionnaire_PPQ.docx DOCX document

Notice history

Notices posted for this opportunity, newest first
Notice Type Posted
Scanning Electron Microscope Accessories Latest Award Notice
Accessories for Field Emission Scanning Electron Microscope This notice · Original Award Notice

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