STATEMENT OF WORK.pdf

Atomic Force Microscope Procurement

1. Objective/Requirements The Optics Branch (Code 551) at the NASA Goddard Space Flight Center (GSFC) requires the procurement of an Atomic Force Microscope (AFM) system. The principle of operation of an AFM is that a nanoscale tip is attached to a small cantilever which forms a spring. As the tip contacts the surface, the cantilever bends, and the bending is detected using a laser diode and a split photodetector. This bending is indicative of the tip-sample interaction force.

This metrology system will be used as a high resolution scanning probe to resolve features on the surface of a solid or thin-film samples in the order of a fractions of a nanometer. This system will support research and development activities to produce optical thin-films that could be incorporated on the component of an optical system to improve performance. Other types of surfaces that could be characterized with this AFM system include polymers, ceramics, composites, glass and biological samples.

2. Requirements of the AFM system

The contractor shall provide the AFM system with the following specifications:

1. A true tip-scanning configuration. This means the tip is actuated in all axes for the scanning motion, XY and Z. Moving the sample in XY or XYZ for scanning is not acceptable.

2. A system (height) noise better than 50 pm RMS.

3. A single-axis vertical engage mechanism.

4. The Engage mechanism must be automated, and fully software controlled.

5. The dither piezo used to actuate the cantilever oscillation in AC modes, must be located inside the tip holder, and located directly underneath the cantilever substrate.

6. The AFM must have a software-controlled Motorized XY stage with possibility to accept samples with a minimum size of 150 mm diameter and 15 mm thick.

7. The motorized sample stage must have an XY travel range of minimum 150x150 mm.

The travel must be controlled by software.

8. Scanner for all 3 (XYZ) axes must form a single unit, which must also actuates the tip.

9. The sample stage must have vacuum to hold the samples down.

10. The scan head must use a low-noise red laser light.

11. The closed-loop XY noise should be < 0.5 nm RMS, in typical imaging bandwidth

(625Hz).

12. The Z sensor noise should be <0.2 nm RMS, in typical imaging bandwidth (625Hz)

13. The AFM must be capable of scanning atomic resolution images on atomic lattice structures

3. Place of Performance

NASA-GSFC located in Building 5, Room W90.

4. Period of Performance

The AFM system and all related accessories shall be delivered and installed within 30 days or better upon receipt of order with freight charges prepaid and added.