STATEMENT OF WORK.pdf

STATEMENT OF WORK

1. Objective/Requirements Dimension Edge Atomic Force Microscope

2. Characteristics, Scope, and Specs

EDGE-BASE Dimension Edge Scanning Probe Microscope

• Dimension Edge Large Sample Tip Scanning Probe Microscope performs all major SPM imaging techniques on samples up to 150 mm in diameter / 15 mm thick. Bidirectional stage repeatability (X-Yaxis):

8 microns (typical); stage programmable for multi-site measurements; video optics 180-micron to 1465-micron aspect ratio of 1.3:1.

• Now includes our proprietary PeakForce Tapping and ScanAsyst Modes, using exclusive Peak Force Tapping technology.

• Dimension Edge XYZ Closed-Loop Application Module-ready SPM Scan Head with a nominal range of 90-micron x 90-micron and vertical range of 10-microns, closed-loop operation enabled with thermally compensating sensors in its X, Y, and Z-axis for high accuracy/precision for imaging, positioning, zooming and nanomanipulation.

• 150mm General Purpose Vacuum Chuck

• Dimension Edge Control System based on Dimension Edge NanoDrive controller with built-in signal access. Includes software configurable signal routing and signal access, multiple configurable digital feedback loops, and configurable dual high-speed digital lock-ins. Includes control of air and vacuum (but not actual pumps) for motorized stage. Includes computer with Intel iCore processor with Windows 10 operating system and v8.05 NanoDrive software with new graphical user interface. Offers more efficiency and shorter learning curve in all modes supported.

• Includes NanoPlot Nanolithography Software that enables creation of lithographic patterns on sample surfaces and allows previously-acquired AFM images to be transferred from main UI to NanoPlot with a single mouse-click to guide placement of lithographic patterns. Lithographic patterns can be generated interactively or by importing PostScript level-1 data.

Includes NanoPlot Nanolithography software license.

• Includes the powerful NanoScope Analysis Software Package to support image analysis in real-time with linked communication to NanoScope and NanoDrive software v8.x and later. Features include image processing and analysis history with Undo/Redo functions, a save your work process function, 3D rendering and skin overlay, section, Fourier and bearing analysis, image math, data filtering, force curve analysis, and many rendering options for report formatting.

Compatible with all Bruker data file versions.

Includes Air Vacuum Module Kit (Model AVMK) which supplies compressed air and vacuum for the motorized sample stage of Dimension Edge AFM system.

(NOTE: Does NOT supply compressed air for air table.)

• Two Contact / tapping (air) cantilever holders (Model DAFMCH), 20 Sharp Nitride Lever probes (Model SNL-10), 30 TappingMode Probes (Model RTESP-300, RFESP-75, OTESPA-R3) and a set of accessories included

• Includes Operation Manuals in HTML format on computer delivered with system. No hardcopy manuals will be provided.

• CE compliant

DMEDGE-

SINGLE

One 30-inch LCD monitor, 2560x1600, 50/60Hz refresh rate, auto switching

DMEDGE-

SPOM

Surface Potential Microscopy (SPoM for the the Dimension Edge SPM

LTSPW-V2 48N/m, 190kHz, 4-Sided Tip, No Coatings.Premium Long- Lever TappingMode imaging probes on improved V2 cantilever

ITCS Two Days Installation and Training for New Systems

3. Place of Performance

Charles He NASA Goddard Space Flight Center 8800 Greenbelt Road Greenbelt MD 20771

4. Period of Performance Lead time: 16-20 weeks