Specifications for Xray Absorption Spectrometer.pdf

SPECIFICATIONS FOR LABORATORY-SCALE X-RAY ABSORPTION SPECTROMETER

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I. OVERVIEW: The NRL has a critical need for an onsite, benchtop X-ray absorption spectrometer system with the capability to perform measurements in support of research on advanced nanomaterials for energy storage and conversion applications.

II. BACKGROUND: X-ray absorption spectroscopy (XAS) is a critical tool for executing research on the development of nanomaterials, providing important information on such characteristics as elemental oxidation state and medium-range atomic structure. In the past, such measurements would need to be performed at one of the few laboratories around the world, with synchrotron radiation sources (such as the National Synchrotron Light Source at Brookhaven National Laboratory). However, recent developments in X-ray optics have made it possible to approximate the function of synchrotron-based XAS in compact (i.e., benchtop) spectrometers that can be installed in almost any common laboratory setting. Having readily available onsite XAS capability would significantly accelerate materials research, negating the need to schedule time at centralized synchrotron facilities and providing more flexibility for researchers in instrument setup.

III. SCOPE: The X-ray absorption spectrometer shall provide data for X-ray absorption fine structure (XAFS) and X-ray Near-Edge Fine Structure (XANES) analysis with results that approach those generated at synchrotron radiation sources. The benchtop X-ray absorption spectrometer system is required for a new program on “Integrated Computational Materials Engineering” that starts on 1 October 2020.

IV. SPECIFICATIONS AND SALIENT CHARACTERISTICS:

The system SHALL meet all of the following minimum technical, physical, and performance requirements:

A. The system shall incorporate a hard X-ray source that supports the collection of spectra in an X-ray energy range as low as 5 keV and as high as 11 keV, a range that covers commonly encountered elements in materials science

B. The system shall incorporate a hard X-ray source with a brightness that permits analysis of functional materials under in situ and operando conditions

C. The system shall provide data of sufficient resolution and signal intensity to perform XAFS analysis to determine medium-range structure of a variety of materials, including nanostructured metal oxides and phosphates

D. The system’s spectromes hall provide data of sufficient resolution and signal intensity to perform XANES analysis to determine element-specific oxidation state in a variety of materials, including nanostructured metal oxides and phosphates in complex multi-element compositions

E. The system shall collect data in transmission-mode configurations

F. The sample compartment of said spectrometer shall accommodate a range of cell designs to include electrochemical and battery-type cells that allow for in situ and operando analysis and spectrometer sensitivity must be sufficient to probe specimens in said cells at sufficient resolution for XANES and XAFS analysis

G. Said spectrometer shall fit in an areal footprint of not more than 6 ft × 6 ft (not including controlling computer)

H. Said spectrometer shall be compatible with a typical instrument laboratory setting in terms of power and utility needs, and safety considerations.