SOW Low Temperature Measurement System.docx

NIST Requirements Document Low Temperature Electrical Measurement System I. Background:

The National Institute of Standards and Technology (NIST) Nanoscale Device Characterization Division (NDCD) provides leadership in developing and advance the measurement and knowledge infrastructure to characterize nano- and atom-scale engineered materials and solid-state devices for innovation in information processing, sensing, and future quantum technologies.

The Division has developed the capability to perform phosphorus doping on Si (100) surfaces with atomic-scale precision, using ultra-high vacuum scanning tunneling microscopes (UHV STMs) in the atom-based laboratory. A key focus of the atom-based devices project is to establish the ability to fabricate atomic-scale dopant devices with single-atom accuracy. Through hydrogen mask lithography guided by STM, individual dopant atoms can be precisely positioned within the three-dimensional silicon lattice—representing the highest level of precision currently achievable in semiconductor electronics. This work is advancing the frontier of electronic and quantum devices and sensors, enabling operation at the limits of single electrons and spins on deterministically placed atoms.

In parallel, the Division is fabricating gate-defined quantum dots at silicon metal–oxide–semiconductor (Si-MOS) interfaces for use in quantum device applications. These technologies are foundational for future chip-scale quantum information processing, quantum simulators, and deployable quantum electrical standards.

To continue pushing the boundaries of performance and complexity in devices and systems—especially as traditional CMOS scaling faces fundamental challenges—innovative measurement techniques are essential to validate the authenticity and reliability of materials and components. To support this, the Division requires a low-temperature electrical measurement system for initial screening and triaging of devices before they undergo dilution refrigerator testing, as well as for a range of critical measurements that only require operation at 4 K.

II. Minimum Requirements:

Line Item 0001: Quantity one (1) Low temperature (4 degrees Kelvin) Electrical measurement system

1. The system must have a minimum 10 in. diameter 4K base plate to be able to mount and test several samples at once.

1. The system must be a liquid Helium free cooler that can reach temperatures of 4 Kelvin or lower with the sample mounted.

1. The system must be able to reach base temperature of 4 Kelvin or below in less than four hours, with an ultimate base temperature below 3K.

1. The system must have at minimum 1.0 W cooling power at 4.2 Kelvin.

1. Should provide sample fixtures that can be attached to the cold finger; fixtures must have electrical leads that can be easily connected to standard chip carriers or vendor provided carrier to mount our samples.

1. The system needs at minimum two 25-pin Micro-D connectors and eight SMA cables interfaced to the base plate. The connections should be designed to have minimum heat loss.

1. The system must have at least two Fischer to 25-pin Micro-D connectors on the outer flange to be able to interface with a breakout box.

1. The system should be standalone with the vacuum shrouds and the vacuum pumps and should have a stable mounting on the floor.

1. The system must include a temperature controller with built in temperature sensors and must have the ability to control the temperature from 4 K to 50 K to make current voltage (I-V) measurements at desired intervals of temperature.

1. Optical access is not required for the sample stage.

III. Warranty:

Warranty shall be, at a minimum, 12 months from date of Government acceptance and shall be in accordance with terms in FAR 52.212-4. Warranty shall commence upon acceptance of the system by the Government and at a minimum shall include all parts and labor associated with repair or replacement of defective components.

IV. Delivery:

Delivery term shall be FOB Destination (or equivalent incoterms, such as DDP) and shall occur within 26 weeks of order placement.

FOB Destination means: The contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery.

The contractor shall deliver all Line Items to:

NIST Shipping and Receiving 100 Bureau Drive, Building 301 Gaithersburg, MD 20899 C/O TPOC (Richard Silver, 220/B356)

V. Inspection/Acceptance:

In addition to the inspection and acceptance terms articulated in the specific FAR clause 52.212-4, the Government reserves the right to perform such performance tests and evaluations as defined below to verify specified system performance. Such tests and evaluations, if performed, shall be conducted within the environment that the system is to be operated. The Contractor has the right to be present during the tests and evaluations, if performed, at the Contractor’s expense.

Performance Test:

Inspection tests shall be performed at NIST in the atom-based lab by the Technical Point of Contact (TPOC). These tests shall include:

1. Visual Inspection

1. Vacuum test. Test pumps etc

1. Install and test base temperature that it can reach with and without load (sample)

1. Check electrical feedthroughs and cables for low resistance connections and no crosstalk.

1. Ensure sensors and controllers are working properly.

The government shall accept equipment if it meets all performance standards outlined in the inspection tests above.

NIST may choose at its discretion to forego this part of acceptance testing.

A visual inspection of the equipment will be performed by the NIST POC to identify surface defects or any form of indication that any equipment was damaged during transport to NIST. The Government shall have sole discretion to require repair or replacement of damaged and/or nonconforming supplies at no cost to the Government. The Government at any time prior to acceptance shall reject the equipment due to defects and/or nonconformance. The vendor is responsible for latent defects discovered any time after final inspection. However, the extent of its liability shall be prorated over the useful life of the equipment.

Ownership of the equipment shall transfer to NIST upon acceptance by the Government.

The Government will test, inspect, and accept or reject the equipment within 45 working days of the receipt of the equipment unless otherwise indicated above. The Government reserves the right to conduct quality assurance testing to confirm that a given instrument(s) meets the manufacturer’s and/or the Government’s performance specifications. It is anticipated that the equipment will meet all manufacturer’s specifications and/or the Government’s performance specifications identified in the most recent operations and maintenance manual for each piece of equipment and/or in this document.

VI: Payment Terms:

The Contractor will be paid, in accordance with the payments clause in the contract and as otherwise noted in this document, upon receipt of a proper invoice.

NOTE: Partial shipments and partial invoices will not be accepted, unless otherwise requested and accepted by the Contracting Officer prior to award offer. Proposed payment schedules shall be submitted with vendor’s response to the RFQ for consideration.